公开(公告)号：US20220020671A1

公开(公告)日：2022-01-20

申请号：US17380583

申请日：2021-07-20

Applicant: Electronics and Telecommunications Research Institute

Inventor： Dong Yun JUNG ,  Hyun Gyu JANG ,  Sung Kyu KWON ,  Kun Sik PARK ,  Jong Il WON ,  Seong Hyun LEE ,  Jong Won LIM ,  Doo Hyung CHO

IPC: H01L23/495 ,  H01L23/00

Abstract: The present invention minimizes parasitic inductance at the time of packaging a semiconductor that requires high efficiency and high-speed switching driving. In implementing a semiconductor package composed of one or more switching devices and one or more diode devices, the present invention provides a flip-stack structure in which a switching device is mounted on an insulating substrate or a metal frame, a flat metal is bonded onto the switching device, and a diode device is flipped and stacked on the flat metal, and accordingly, the flat metal with a large area is used for connection between the devices and between the devices and the insulating substrate, thereby minimizing parasitic inductance generated at a time of semiconductor packaging and automating the entire process of the semiconductor packaging.

公开(公告)号：US20220299554A1

公开(公告)日：2022-09-22

申请号：US17510856

申请日：2021-10-26

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Dong Yun JUNG ,  Hyun Gyu JANG ,  Kun Sik PARK ,  JONG IL WON ,  Sung Kyu KWON ,  Jong Won LIM ,  Doo Hyung CHO

IPC: G01R31/00

Abstract: The apparatus for ESD test includes a micro-controller unit client, a low voltage supply configured to output a low voltage on the basis of control by the micro-controller unit, a high voltage supply configured to output a high voltage on the basis of control by the micro-controller unit, and an ESD generator configured to generate an ESD voltage for an ESD test of a device under test (DUT) by using the low voltage and the high voltage, on the basis of control by the micro-controller unit. The ESD generator is a semiconductor integrated circuit module where a charging semiconductor switch, a discharging semiconductor switch, a switch driving block controlling a switching operation of each of the charging semiconductor switch and the discharging semiconductor switch, and a plurality of passive elements connected to the charging semiconductor switch and the discharging semiconductor switch are implemented as package, for generating the ESD voltage.