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公开(公告)号：US20180314953A1
公开(公告)日：2018-11-01
申请号：US15498779
申请日：2017-04-27
Applicant: EntIT Software LLC
Inventor： Elad Benedict , Einat Atedgi , Ohad Assulin , Boaz Shor
Abstract: Techniques to create and use cluster models to predict build failures are provided. In one aspect, clusters in a set of builds may be identified. The identified clusters may be used to create a model. The model may be used to predict causes of build failures. In another aspect, a failed build may be identified. A clustering model may be retrieved. A cause of problems with the failed build may be predicted using the clustering model.
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公开(公告)号：US11200377B2
公开(公告)日：2021-12-14
申请号：US15498779
申请日：2017-04-27
Applicant: EntIT Software LLC
Inventor： Elad Benedict , Einat Atedgi , Ohad Assulin , Boaz Shor
IPC: G06F8/00 , G06N20/00 , G06F40/186 , G06F40/284 , G06F7/535 , G06F8/71 , G06N5/04 , G06F8/65
Abstract: Techniques to create and use cluster models to predict build failures are provided. In one aspect, clusters in a set of builds may be identified. The identified clusters may be used to create a model. The model may be used to predict causes of build failures. In another aspect, a failed build may be identified. A clustering model may be retrieved. A cause of problems with the failed build may be predicted using the clustering model.
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公开(公告)号：US11494288B2
公开(公告)日：2022-11-08
申请号：US15680092
申请日：2017-08-17
Applicant: EntIT Software LLC
Inventor： Gabi Shalev , Itay Ben-Yehuda , Raz Regev , Elad Benedict
Abstract: In some examples, test relevancy prediction for code changes may include ascertaining files for a commit for a build, and for each test of a plurality of tests, determining a score based on a weight assigned to a file of the ascertained files. Test relevancy prediction for code changes may further include ordering each test of the plurality of tests according to the determined score, and identifying, based on the ordering of each test of the plurality of tests, tests from the plurality of tests for which the score exceeds a specified threshold. The identified tests may represent tests that are to be applied to the build.
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公开(公告)号：US10437910B2
公开(公告)日：2019-10-08
申请号：US15564910
申请日：2015-04-29
Applicant: ENTIT Software LLC
Inventor： Liron Tzabari , Elad Benedict , Doron Levi
Abstract: Examples disclosed herein relate, among other things, to determining a trend correlation. In one aspect, a method is disclosed. The method may include, for example, receiving a first data set associated with a first parameter of an electronic device and a second data set associated with a second parameter of the electronic device. The method may also include generating a first trend set based on the first data set, and generating a second trend set based on the second data set. The method may further include detecting, based on the first trend set and the second trend set, a trend correlation between the first parameter of the electronic device and the second parameter of the electronic device, and providing for display correlation information describing the trend correlation.
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Patent Agency Ranking
公开(公告)号：US10169223B2
公开(公告)日：2019-01-01
申请号：US15491542
申请日：2017-04-19
Applicant: EntIT Software LLC
Inventor： Ohad Assulin , Elad Benedict , Shaul Strachan , Raz Regev , Gabi Shalev
Abstract: Techniques for identifying a build commit that caused a test failure are provided. A build which includes a failed test may be identified. For each commit in the build a weighting factor may be calculated for files that have been previously associated with the failed test. The weighting factor may be based on the number of times the file has been associated with the failed test and the total number of tests. A weighting factor may also be calculated for files that have not been previously associated with the failed test based on the number of times the file appears with other files that are associated with the failed test. The weighting factors may be added to create a score for the commit. The scores for the commits in the build may be ordered. The higher the score, the more likely the commit was the cause of the failed test.
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公开(公告)号：US20180307593A1
公开(公告)日：2018-10-25
申请号：US15491542
申请日：2017-04-19
Applicant: EntIT Software LLC
Inventor： Ohad Assulin , Elad Benedict , Shaul Strachan , Raz Regev , Gabi Shalev
CPC classification number: G06F11/3692 , G06F8/71
Abstract: Techniques for identifying a build commit that caused a test failure are provided. A build which includes a failed test may be identified. For each commit in the build a weighting factor may be calculated for files that have been previously associated with the failed test. The weighting factor may be based on the number of times the file has been associated with the failed test and the total number of tests. A weighting factor may also be calculated for files that have not been previously associated with the failed test based on the number of times the file appears with other files that are associated with the failed test. The weighting factors may be added to create a score for the commit. The scores for the commits in the build may be ordered. The higher the score, the more likely the commit was the cause of the failed test.
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公开(公告)号：US10248548B2
公开(公告)日：2019-04-02
申请号：US15560571
申请日：2015-04-15
Applicant: ENTIT Software LLC
Inventor： Liron Tzabari , Elad Benedict , Nathan Grunzweig
Abstract: A technique includes obtaining code coverage information related to lines of code. The code coverage information indicates how the lines of code are covered by a plurality of tests. The technique includes generating a two-way mapping based on the code coverage information. The two-way mapping includes a first mapping that maps a particular test in the plurality of tests to at least one line in the lines of code, which is covered by the particular test; and a second mapping that maps a particular line of code in the lines of code to at least one test in the plurality of tests, which covers the particular line of code.
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公开(公告)号：US20180121390A1
公开(公告)日：2018-05-03
申请号：US15564910
申请日：2015-04-29
Applicant: ENTIT Software LLC
Inventor： Liron Tzabari , Elad Benedict , Doron Levi
IPC: G06F17/18
CPC classification number: G06F17/18 , G06F2216/03 , G06K9/00536 , G06K9/6203
Abstract: Examples disclosed herein relate, among other things, to determining a trend correlation. In one aspect, a method is disclosed. The method may include, for example, receiving a first data set associated with a first parameter of an electronic device and a second data set associated with a second parameter of the electronic device. The method may also include generating a first trend set based on the first data set, and generating a second trend set based on the second data set. The method may further include detecting, based on the first trend set and the second trend set, a trend correlation between the first parameter of the electronic device and the second parameter of the electronic device, and providing for display correlation information describing the trend correlation.
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公开(公告)号：US20180101468A1
公开(公告)日：2018-04-12
申请号：US15560571
申请日：2015-04-15
Applicant: ENTIT Software LLC
Inventor： Liron Tzabari , Elad Benedict , Nathan Grunzweig
CPC classification number: G06F11/3676 , G06F8/33 , G06F8/71 , G06F8/75 , G06F11/3664 , G06F11/3688 , G06F11/3692
Abstract: Examples disclosed herein relate to providing code coverage information. The examples enable obtaining code coverage information related to lines of code. The code coverage information may indicate how the lines of code are covered by a plurality of tests. The examples further enable generating a two-way mapping based on the code coverage information. The two-way mapping may comprise a first mapping that maps a particular test in the plurality of tests to at least one line in the lines of code that is covered by the particular test and a second mapping that maps a particular line of code in the lines of code to at least one test in the plurality of tests that covers the particular line of code.
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