公开(公告)号：US12053330B2

公开(公告)日：2024-08-06

申请号：US17356262

申请日：2021-06-23

申请人： Exo Imaging, Inc.

发明人： Jonathan Strode ,  Rajeev Sivadasan ,  Gordon Sasamori

IPC分类号： A61B8/00 ,  B06B1/02 ,  B06B1/06 ,  G01S15/89

CPC分类号： A61B8/58 ,  B06B1/0207 ,  B06B1/0292 ,  B06B1/0622 ,  G01S15/8915 ,  B06B2201/40 ,  B06B2201/51 ,  B06B2201/55 ,  B06B2201/76

摘要： Described herein are methods and systems for testing transducers and associated integrated circuits. In some cases, a method or system described herein can comprise modulating a bias voltage using a test signal in order to produce a modulated bias voltage signal useful in testing a plurality of transducers of a transducer array in parallel.