公开(公告)号：US20170303057A1

公开(公告)日：2017-10-19

申请号：US15642940

申请日：2017-07-06

申请人： FAIRCHILD SEMICONDUCTOR CORPORATION

发明人： Philip CRAWLEY ,  William D. LLEWELLYN ,  Majid SHUSHTARIAN ,  Earl D. SCHREYER

IPC分类号： H04R29/00

CPC分类号： H04R29/001

摘要： In one general aspect, a method can include calculating, at a calibration temperature of a speaker, a calibration parameter through a coil of the speaker in response to a first test signal, and can include sending a second test signal through the coil of the speaker. The method can also include measuring a parameter through the coil of the speaker based on the second test signal, and calculating a temperature change of the coil of the speaker based on the parameter and based on the calibration parameter at the calibration temperature.

公开(公告)号：US20140126730A1

公开(公告)日：2014-05-08

申请号：US14074314

申请日：2013-11-07

申请人： Fairchild Semiconductor Corporation

发明人： Philip CRAWLEY ,  William D. LLEWELLYN ,  Majid SHUSHTARIAN ,  Earl D. SCHREYER

IPC分类号： H04R29/00

CPC分类号： H04R29/001

摘要： In one general aspect, a method can include calculating, at a calibration temperature of a speaker, a calibration parameter through a coil of the speaker in response to a first test signal, and can include sending a second test signal through the coil of the speaker. The method can also include measuring a parameter through the coil of the speaker based on the second test signal, and calculating a temperature change of the coil of the speaker based on the parameter and based on the calibration parameter at the calibration temperature.

摘要翻译： 在一个一般方面，一种方法可以包括响应于第一测试信号在扬声器的校准温度下计算通过扬声器的线圈的校准参数，并且可以包括通过扬声器的线圈发送第二测试信号 。 该方法还可以包括基于第二测试信号测量通过扬声器的线圈的参数，并且基于参数并且基于校准温度下的校准参数来计算扬声器的线圈的温度变化。