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公开(公告)号:US11719651B2
公开(公告)日:2023-08-08
申请号:US17340902
申请日:2021-06-07
发明人: Ariane Stiebeiner , Georgio Balatzis , Simon Raab , Stefan Wagner
IPC分类号: G01N23/046 , G01N23/20025 , G06F30/20
CPC分类号: G01N23/046 , G01N23/20025 , G06F30/20 , G01N2223/3075
摘要: A system and method of inspecting a plurality of objects using a computed tomography (CT) system is provided. The method includes acquiring an image of a fixture used for holding the plurality of objects with the CT system. A first electronic model of the fixture is generated. The objects are placed in the fixture. An image of the fixture and the objects is acquired with the CT system. A second electronic model of the fixture and the objects is generated. A third electronic model of the objects is defined based at least in part on subtracting the first electronic model from the second electronic model. Dimensions of the objects from the third electronic model are compared with a computer aided design (CAD) model. A report is output based at least in part on the comparison of the objects from the third electronic model with the CAD model.