SHIELDED DETECTOR FOR CHARGED PARTICLE MICROSCOPY

    公开(公告)号:US20250069844A1

    公开(公告)日:2025-02-27

    申请号:US18456048

    申请日:2023-08-25

    Applicant: FEI Company

    Abstract: Systems, components, and methods for detecting characteristic signals are described. A detector includes a detector cell. The detector cell can be configured to generate an electrical signal in response to a particle incident on an active layer of the detector cell, The active layer can define an absorption surface. The detector can include a filter. The filter can include a membrane of carbon material. The filter can be disposed relative to the detector cell to shield the absorption surface from a subset of the incident particles. The subset of the incident particles can include electrons, ions, and photons. The photons can have an energy less than about 40 eV.

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