公开(公告)号：US20180031712A1

公开(公告)日：2018-02-01

申请号：US15547331

申请日：2016-07-21

Applicant: FTLAB CO., LTD.

Inventor： Jae Jun KO ,  Yuong Gweon KIM

IPC: G01T1/178 ,  G01T7/00 ,  G01T1/185

CPC classification number: G01T1/178 ,  G01T1/185 ,  G01T7/00 ,  H01J47/02

Abstract: Disclosed in an alpha particle detection apparatus using a dual probe structured ionization chamber and a differential amplifier, the apparatus including: an ionization chamber forming electric field thereinside by bias power applied to a surface thereof; a main probe unit absorbing ionic charges generated in an occurrence of alpha (α) decay in the ionization chamber; a guard ring unit absorbing leakage current generated between the ionization chamber and the main probe unit and flowing the leakage current to a ground; an auxiliary probe allowing surrounding noise to be introduced therein; first and second preamplifiers amplifying fine electrical signals to a predetermined magnitude; and a differential canceling a noise signal and outputting an alpha particle detection signal by amplifying a voltage difference between the preamplified electrical signals. As such, it is possible to effectively detect alpha (α) particles which are a type of radiation.