Effective photoresist stripping process for high dosage and high energy ion implantation
    1.
    发明授权
    Effective photoresist stripping process for high dosage and high energy ion implantation 有权
    有效的光刻胶剥离工艺,用于高剂量和高能离子注入

    公开(公告)号:US07144673B2

    公开(公告)日:2006-12-05

    申请号:US10971268

    申请日:2004-10-21

    IPC分类号: G03F7/30 G03F7/42

    CPC分类号: G03F7/423

    摘要: The present subject matter relates to a method of stripping a photoresist after the photoresist film has been subjected to a high dose and high energy ion implant process. The method involves soaking the photoresist film in DI water, dry etching with oxygen plasma, and immersing in Caro's acid solution to improve the throughput of removing the film from the underlying substrate. The method can also be used to strip photoresist that has been hardened or altered by other types of processes such as dry etch transfer steps and chemical treatments. In some applications, the dry etching step may be omitted from the stripping process or the dry etching step may be combined with the water soak in an integrated process.

    摘要翻译: 本主题涉及在光致抗蚀剂膜已经经受高剂量和高能量离子注入工艺之后剥离光致抗蚀剂的方法。 该方法包括将光致抗蚀剂膜浸入去离子水中,用氧等离子体进行干法蚀刻,并将其浸入Caro酸溶液中以提高从底层衬底去除膜的通过量。 该方法还可用于剥离已经通过其他类型的工艺如干蚀刻转移步骤和化学处理而被硬化或改变的光致抗蚀剂。 在一些应用中,干法蚀刻步骤可以从剥离工艺中省略,或者干法蚀刻步骤可以与一体化工艺中的水组合。

    EFFECTIVE PHOTORESIST STRIPPING PROCESS FOR HIGH DOSAGE AND HIGH ENERGY ION IMPLANTATION
    2.
    发明申请
    EFFECTIVE PHOTORESIST STRIPPING PROCESS FOR HIGH DOSAGE AND HIGH ENERGY ION IMPLANTATION 有权
    高剂量和高能量离子植入的有效的光电子剥离工艺

    公开(公告)号:US20060088784A1

    公开(公告)日:2006-04-27

    申请号:US10971268

    申请日:2004-10-21

    IPC分类号: G03C11/12

    CPC分类号: G03F7/423

    摘要: The present subject matter relates to a method of stripping a photoresist after the photoresist film has been subjected to a high dose and high energy ion implant process. The method involves soaking the photoresist film in DI water, dry etching with oxygen plasma, and immersing in Caro's acid solution to improve the throughput of removing the film from the underlying substrate. The method can also be used to strip photoresist that has been hardened or altered by other types of processes such as dry etch transfer steps and chemical treatments. In some applications, the dry etching step may be omitted from the stripping process or the dry etching step may be combined with the water soak in an integrated process.

    摘要翻译: 本主题涉及在光致抗蚀剂膜已经经受高剂量和高能量离子注入工艺之后剥离光致抗蚀剂的方法。 该方法包括将光致抗蚀剂膜浸入去离子水中,用氧等离子体进行干法蚀刻,并将其浸入Caro酸溶液中以提高从底层衬底去除膜的通过量。 该方法还可用于剥离已经通过其他类型的工艺如干蚀刻转移步骤和化学处理而被硬化或改变的光致抗蚀剂。 在一些应用中,干法蚀刻步骤可以从剥离工艺中省略,或者干法蚀刻步骤可以与一体化工艺中的水组合。