公开(公告)号：US20250020689A1

公开(公告)日：2025-01-16

申请号：US18762393

申请日：2024-07-02

Applicant: FormFactor, Inc.

Inventor： Choon Beng Sia ,  Yoichi Funatoko ,  Isao Kunioka ,  Masanori Watanabe ,  Peter Andrews ,  Ken Dawson

IPC: G01R1/067 ,  G01R31/28

Abstract: Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test (DUT). In some examples, the probe blades are configured to provide a Kelvin electrical connection with the DUT. In some examples, the probe blades include an alignment structure configured to engage with a blade holder when the probe blade is received within a blade-receiving region of the blade holder. The blade holders are configured to separably and operatively attach a probe blade to a probe system. In some examples, the blade holders include the probe blade. The probe systems are configured to electrically test the DUT and include the blade holder.