公开(公告)号：US20140327461A1

公开(公告)日：2014-11-06

申请号：US14270235

申请日：2014-05-05

Applicant: FormFactor, Inc.

Inventor： Li Fan ,  Darcy K. Kelly-Greene ,  Edward J. Milovic ,  Gensaku Nagai ,  Mukesh K. Selvaraj ,  Jim Zhang

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06716 ,  G01R1/06727 ,  G01R1/06733 ,  G01R1/07342 ,  G01R1/07371 ,  G01R1/36 ,  G01R35/00

Abstract: A probe card assembly can comprise a guide plate comprising probe guides for holding probes in predetermined positions. The probe card assembly can also comprise a wiring structure attached to the guide plate so that connection tips of the probes are positioned against and attached to contacts on the wiring structure. The attachment of the guide plate to the wiring structure can allow the wiring structure to expand or contract at a greater rate than the guide plate. The probes can include compliant elements that fail upon high electrical current and thermal stresses located away from the contact tips.

Abstract translation: 探针卡组件可以包括导板，其包括用于将探针保持在预定位置的探针引导件。 探针卡组件还可以包括附接到引导板的布线结构，使得探针的连接尖端定位成抵靠并附接到布线结构上的触点。 引导板到布线结构的附接可以使布线结构以比引导板更大的速率膨胀或收缩。 探针可以包括顺应元件，其在远离接触尖端的高电流和热应力下失效。

公开(公告)号：US09588139B2

公开(公告)日：2017-03-07

申请号：US14270235

申请日：2014-05-05

Applicant: FormFactor, Inc.

Inventor： Li Fan ,  Darcy K. Kelly-Greene ,  Edward J. Milovic ,  Gensaku Nagai ,  Mukesh K. Selvaraj ,  Jim Zhang

IPC: G01R1/067 ,  G01R35/00 ,  G01R1/36 ,  G01R1/073

CPC classification number: G01R1/06716 ,  G01R1/06727 ,  G01R1/06733 ,  G01R1/07342 ,  G01R1/07371 ,  G01R1/36 ,  G01R35/00

Abstract: A probe card assembly can comprise a guide plate comprising probe guides for holding probes in predetermined positions. The probe card assembly can also comprise a wiring structure attached to the guide plate so that connection tips of the probes are positioned against and attached to contacts on the wiring structure. The attachment of the guide plate to the wiring structure can allow the wiring structure to expand or contract at a greater rate than the guide plate. The probes can include compliant elements that fail upon high electrical current and thermal stresses located away from the contact tips.

Abstract translation: 探针卡组件可以包括导板，其包括用于将探针保持在预定位置的探针引导件。 探针卡组件还可以包括附接到引导板的布线结构，使得探针的连接尖端定位成抵靠并附接到布线结构上的触点。 引导板到布线结构的附接可以使布线结构以比引导板更大的速率膨胀或收缩。 探针可以包括顺应元件，其在远离接触尖端的高电流和热应力下失效。