Wafer edge engineering method and device
    1.
    发明授权
    Wafer edge engineering method and device 失效
    晶圆边工程方法及装置

    公开(公告)号:US06265328B1

    公开(公告)日:2001-07-24

    申请号:US09239477

    申请日:1999-01-28

    IPC分类号: B05C1102

    摘要: The present invention provides an apparatus (400) (500) for abating edge material from a substrate, e.g., SOI. The apparatus includes, among other elements, a housing and a rotatable member (401) coupled to the housing. The rotatable member is a susceptor, which is relatively flat for securing a substrate. A movable dispensing head (421) is coupled to the housing and is overlying the rotatable member. The movable dispensing head (421) is operable to emit a stream of directed fluid to one or more locations of the susceptor. The apparatus also includes a fluid source, which is coupled to the movable dispensing head. The fluid source provides fluid to ablate material from the substrate.

    摘要翻译: 本发明提供一种用于从衬底(例如SOI)减缓边缘材料的装置(400)(500)。 除了其它元件之外,该装置包括壳体和联接到壳体的可旋转构件(401)。 可旋转构件是一个基座,它相对平坦,用于固定基板。 可移动分配头(421)联接到壳体并且覆盖在可旋转构件上。 可移动分配头(421)可操作以将定向流体流发射到基座的一个或多个位置。 该装置还包括流体源,其连接到可移动分配头。 流体源提供流体以从基底中烧蚀材料。