Sensor for Lithographic Apparatus and Method of Obtaining Measurements of Lithographic Apparatus
    1.
    发明申请
    Sensor for Lithographic Apparatus and Method of Obtaining Measurements of Lithographic Apparatus 有权
    用于平版印刷设备的传感器和获得光刻设备测量的方法

    公开(公告)号:US20070273869A1

    公开(公告)日:2007-11-29

    申请号:US10582247

    申请日:2004-12-09

    IPC分类号: G01B9/00

    CPC分类号: G03F7/70591 G03F7/7085

    摘要: A sensor arrangement may be used to measure properties, such as optical properties, of a device arranged to process substrates. The sensor arrangement includes a substrate having the following: a plurality of sensor elements provided as an integrated circuit in the substrate, for each one of the plurality of sensor elements associated electronic circuitry comprising a processing circuit connected to the sensor element and an input/output interface connected to the processing circuit, and a power supply unit configured to supply operating power only to the electronic circuitry associated with one or more of the plurality of sensor elements which are in use. The at least one sensor element and possibly the processing electronics, the input/output unit, and/or the power supply unit may be provided as one or more integrated circuits or other structures in the substrate.

    摘要翻译: 可以使用传感器装置来测量布置成处理衬底的器件的性质,例如光学性质。 所述传感器装置包括具有以下基板:多个传感器元件,作为所述基板中的集成电路设置,所述多个传感器元件中的每一个相关联的电子电路包括连接到所述传感器元件的处理电路和输入/输出 接口连接到处理电路,以及电源单元,被配置为仅向与所使用的多个传感器元件中的一个或多个相关联的电子电路提供工作电力。 至少一个传感器元件以及可能的处理电子器件,输入/输出单元和/或电源单元可以被提供为衬底中的一个或多个集成电路或其他结构。

    Lithography system using a programmable electro-wetting mask
    2.
    发明申请
    Lithography system using a programmable electro-wetting mask 审中-公开
    光刻系统使用可编程电润湿面罩

    公开(公告)号:US20070134560A1

    公开(公告)日:2007-06-14

    申请号:US10596598

    申请日:2004-12-01

    IPC分类号: G03F1/00

    CPC分类号: G03F7/70291

    摘要: A maskless lithography system is described having a programmable mask to allow performing several lithographic steps using the same mask. In every lithographic step, the corresponding pattern is obtained by providing a digital pattern to the programmable mask. The programmable mask includes an array of pixels which are based on the electro-wetting principle. According to this principle, every pixel has a transparent reservoir containing a first, non-polar, non-transparent fluid and a second, polar, transparent fluid which are immiscible. Applying a field to the reservoir allows to displace the fluids with respect to each other. This allows to make the pixel either transparent or non-transparent. This lithographic programmable mask allows high resolution and fast setting and refreshing. A corresponding method for performing maskless optical lithography also is described.

    摘要翻译: 描述了具有可编程掩模的无掩模光刻系统,以允许使用相同的掩模执行几个光刻步骤。 在每个光刻步骤中,通过向可编程掩模提供数字图案来获得相应的图案。 可编程掩模包括基于电润湿原理的像素阵列。 根据这个原理,每个像素都有一个透明的容器,它含有不混溶的第一,非极性,不透明的流体和第二个极性透明的流体。 将场施加到储存器允许流体相对于彼此移位。 这允许使像素透明或不透明。 该光刻可编程掩模允许高分辨率和快速设置和刷新。 还描述了用于执行无掩模光学光刻的相应方法。

    Lithographic method of manufacturing a device
    3.
    发明申请
    Lithographic method of manufacturing a device 有权
    制造器件的平版印刷方法

    公开(公告)号:US20060160029A1

    公开(公告)日:2006-07-20

    申请号:US11367810

    申请日:2006-03-01

    IPC分类号: G03F7/00

    摘要: For lithographically manufacturing a device with a very high density, a design mask pattern (120) is distributed on a number of sub-patterns (120a, 120b, 120c) by means of a new method. The sub-patterns do not comprise “forbidden” structures (135) and can be transferred by conventional apparatus to a substrate layer to be patterned. For the transfer, a new stack of layers is used, which comprise a pair of a processing layer (22; 26) and an inorganic anti-reflection layer (24; 28) for each sub-pattern. After a first processing layer (26) has been patterned with a first sub-pattern, it is coated with a new resist layer (30) which is exposed with a second sub-pattern, and a second processing layer (22) under the first processing layer is processed with the second sub-pattern.

    摘要翻译: 为了光刻制造具有非常高密度的器件,通过新的方法将设计掩模图案(120)分布在多个子图案(120a,120b,120c)上。 子图案不包括“禁止”结构(135)并且可以通过常规设备传送到待图案化的基底层。 为了传送,使用新的层叠层,其包括用于每个子图案的一对处理层(22; 26)和无机抗反射层(24; 28)。 在第一处理层(26)已经被图案化为第一子图案之后,其被涂覆有用第二子图案曝光的新抗蚀剂层(30)和在第一子图案下方的第二处理层(22) 用第二子图案处理处理层。