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公开(公告)号：US11796483B2
公开(公告)日：2023-10-24
申请号：US17544758
申请日：2021-12-07
发明人： Liu-Bin Hu , Wei Yang
CPC分类号： G01N21/8806 , G01N21/8851 , G06T7/0006 , G01N2021/8887 , G06T2207/30108
摘要： A device to detect defects in a finished surface by analyzing images thereof includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, and a light source assembly. The processor is used to connect to a camera assembly, and preprocess image obtained of the front of the product to obtain a detection of any defects of the front of the product.
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公开(公告)号：US09475162B2
公开(公告)日：2016-10-25
申请号：US14534367
申请日：2014-11-06
发明人： Hsiu-Lung Chang , Wei Yang , Ke Hu , Jian Zhang
摘要： A positioning device includes a fixing mechanism, a first positioning assembly, a second positioning assembly. The fixing mechanism includes a base, a first moving member movably passing through the base, and a second moving member movably passing through the base. The first positioning assembly includes a bottom board and two first guide portions protruding from the bottom board. Each first guide portion forms one first incline surface. The second positioning assembly includes a base body and two second guide portions. The base body is positioned between the two first guide portions respectively positioned on opposite side surfaces of the base body. Each second guide portion forms a guiding surface. The first moving member is fixed with the bottom board at one end away from the base. The second moving member is fixed with the base body at one end away from the base.
摘要翻译： 定位装置包括固定机构，第一定位组件，第二定位组件。 固定机构包括基座，可移动地穿过基座的第一移动构件和可移动地穿过基座的第二移动构件。 第一定位组件包括底板和从底板突出的两个第一引导部分。 每个第一引导部分形成一个第一倾斜面。 第二定位组件包括基体和两个第二引导部分。 基体位于分别位于基体的相对侧表面上的两个第一引导部之间。 每个第二引导部分形成引导表面。 第一移动部件的一端与基部固定在底板上。 第二移动构件在距基座一端固定有基体。
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公开(公告)号：US11982629B2
公开(公告)日：2024-05-14
申请号：US17540451
申请日：2021-12-02
发明人： Liu-Bin Hu , Wei Yang
CPC分类号： G01N21/8851 , G06T7/0004 , G01N2021/8887 , G06T2207/20081
摘要： A device to detect and analyze defects in a finished surface includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a light source assembly. The processor is used to connect to a first camera module and a second camera module, and preprocess the first image and the second image to obtain a detection and analysis of any defects of the front of the product.
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公开(公告)号：US11940389B2
公开(公告)日：2024-03-26
申请号：US17551526
申请日：2021-12-15
发明人： Liu-Bin Hu , Wei Yang
CPC分类号： G01N21/8806 , G01N21/8803 , G06T7/0004 , G01N2021/8841 , G01N2021/8918
摘要： A device to detect and analyze defects in magnified scale images of a surface of a finished product illuminated with a blue light source and viewed by multiple image-capturing devices each focused on their own spot includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a blue light source assembly. The processor is used to connect to a camera assembly, and preprocess the image of the front of the product to obtain a detection and analysis of any defects of the front of the product.
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公开(公告)号：US11798155B2
公开(公告)日：2023-10-24
申请号：US17551535
申请日：2021-12-15
发明人： Liu-Bin Hu , Wei Yang
CPC分类号： G06T7/0004 , G01N21/8806 , G01N21/8851 , H04N23/56 , G01N2021/8845 , G01N2201/021 , G06T2207/20081
摘要： A device to detect defects in a finished surface by analyzing images thereof taken under lighting of different colors includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, and a light source assembly. The processor connects to a camera assembly, and preprocesses images obtained of the long side surfaces, of the width side surfaces, and of the chamfered side surfaces of the product to detect any defects of these surfaces of the product.
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