公开(公告)号：US20230165555A1

公开(公告)日：2023-06-01

申请号：US17975878

申请日：2022-10-28

Applicant: GE Precision Healthcare LLC

Inventor： Gireesha Chinthamani Rao ,  Ravi Soni ,  Poonam Dalal ,  Chen Liu ,  Dibyajyoti Pati ,  Katelyn Nye

IPC: A61B6/00

CPC classification number: A61B6/52

Abstract: An artificial intelligence (AI) lead marker detection system is employed either as a component of the X-ray imaging system or separately from the X-ray imaging system to scan post-exposure X-ray images to detect and insert various lead markers, to digitize information provided by the type and location of the lead marker, and to employ the marker information in different X-ray system workflow automations. The marker information obtained by the AI lead marker detection system can also provide useful data for use in downstream clinical and quality applications apart from the X-ray system, such as either AI or non-AI analytical applications.

公开(公告)号：US20230169682A1

公开(公告)日：2023-06-01

申请号：US17975889

申请日：2022-10-28

Applicant: GE Precision Healthcare LLC

Inventor： Gireesha Chinthamani Rao ,  Ravi Soni ,  Gopal B. Avinash ,  Poonam Dalal ,  Chen Liu ,  Molin Zhang ,  Zita Herczeg

IPC: G06T7/73 ,  G06T7/33 ,  A61B6/00 ,  G16H30/40

CPC classification number: G06T7/74 ,  G06T7/337 ,  A61B6/5217 ,  A61B6/5229 ,  G16H30/40 ,  G06T2207/10116 ,  G06T2207/20081 ,  G06T2207/30168 ,  G06T2207/20021

Abstract: An artificial intelligence (AI) measurement system for an X-ray image is employed either as a component of the X-ray imaging system or separately from the X-ray imaging system to automatically scan post-exposure X-ray images to detect and locate various landmarks of the anatomy presented within the X-ray image. A set of key image features approximating the locations of the landmarks having known distance relationships to one another is overlaid onto the X-ray image. The positions of the key image features are then adjusted to correspond to the landmarks within the X-ray image. These adjustments are made relative to the prior known distance relationships between the key features, which enables the measurement system to readily calculate desired angular and length measurements between landmarks as a result.