SYSTEMS, METHODS, AND DEVICES FOR MULTIPLE EXPOSURES IMAGING

    公开(公告)号:US20240206839A1

    公开(公告)日:2024-06-27

    申请号:US18434312

    申请日:2024-02-06

    发明人: Noam Weiss

    IPC分类号: A61B6/00 G06T5/50 G06T5/90

    摘要: Systems, methods, and devices for capturing a single image with multiple exposures is provided. An imaging device may be provided comprising a source configured to emit a wave for a time period and a detector configured to receive a signal indicative of the wave. A wave may be emitted for a time period and a signal may be received indicative of the emitted wave. A first image dataset may be saved with a first timestamp referencing a first time within the time period. A second image dataset may be saved with a second timestamp referencing a second time within the time period. The second time may occur after the first time.

    X-RAY EQUIPMENT
    6.
    发明公开
    X-RAY EQUIPMENT 审中-公开

    公开(公告)号:US20230404511A1

    公开(公告)日:2023-12-21

    申请号:US18139614

    申请日:2023-04-26

    IPC分类号: A61B6/00 G06T11/00

    摘要: X-ray equipment that can protect an operator moving around in an imaging room from X rays. The X-ray equipment includes: an X-ray source that irradiates a subject with X rays; a detector that acquires projection data of the subject; and an image generator that generates an X-ray image of the subject using the projection data. The equipment further includes: a position calculating section that calculates the position of the operator in the imaging room; and a control section that moves a protective plate for shielding against X rays to between the X-ray source and the operator according to the position of the operator.

    PROVIDING A COMPLETE SET OF SECOND KEY ELEMENTS IN AN X-RAY IMAGE

    公开(公告)号:US20230233169A1

    公开(公告)日:2023-07-27

    申请号:US18152381

    申请日:2023-01-10

    IPC分类号: A61B6/00 G06T7/00

    摘要: A method comprises: applying a first trained function to first input data to generate first output data, the first output data including first key elements; receiving second input data, the second input data being an X-ray image of an examination region acquired using a first collimation region; applying a second trained function to the second input data to generate second output data, the second output data including second key elements; receiving third input data in response to an incomplete set of second key elements, the third input data including the second key elements and an X-ray image of the examination region acquired using the first collimation region; applying a third trained function to the third input data to generate third output data, the third output data including an estimated third key element to complete the set of second key elements; and providing a complete set of second key elements.

    MOIRÉ MARKER FOR X-RAY IMAGING
    9.
    发明公开

    公开(公告)号:US20230210478A1

    公开(公告)日:2023-07-06

    申请号:US17927063

    申请日:2020-05-29

    申请人: Brainlab AG

    IPC分类号: A61B6/04 A61B6/00

    CPC分类号: A61B6/0492 A61B6/52

    摘要: The present invention relates to a computer-implemented method of determining a rotational position of an object in a coordinate system of an x-ray imaging device. An x-ray image is generated of an object to which a Moiré marker for x-ray imaging is attached. Subsequently, the Moiré pattern generated by the Moiré marker is analysed and the rotational position of the marker and hence of the object is determined in a calculative manner. The Moiré marker for x-ray imaging includes a pattern which results in a significantly different appearance when being observed from slightly different perspectives. One embodiment example of the Moiré marker for x-ray imaging consists of two layers with patterns produced by a material that shields x-ray as good as possible like for example lead, surrounded and spaced apart by material that is highly transparent in x-ray like for example air or light plastics. The size of the openings in the pattern shall preferably be small compared to the distance of the two layers such that a small change in orientation of the marker results in a fairly significant change in the structure of the second layer seen through the aperture of the first layer. Multiple structures with different hole sizes and layer distances can be used to have a larger working range while maintaining accuracy.