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公开(公告)号:US2953736A
公开(公告)日:1960-09-20
申请号:US69772257
申请日:1957-11-20
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L
IPC: H01F38/04
CPC classification number: H01F38/04
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公开(公告)号:US2555975A
公开(公告)日:1951-06-05
申请号:US13968250
申请日:1950-01-20
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L , KUENNING ROBERT W
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公开(公告)号:US2809348A
公开(公告)日:1957-10-08
申请号:US63040156
申请日:1956-12-24
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L , ABBOTT WILLIAM H
IPC: G01R31/02
CPC classification number: G01R31/022
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4.Apparatus for detecting insulation faults in magnet wire utilizing field effect transistor 失效
Title translation: 用于利用场效应晶体管检测电磁线圈绝缘故障的装置公开(公告)号:US3413541A
公开(公告)日:1968-11-26
申请号:US61843067
申请日:1967-02-24
Applicant: GEN ELECTRIC
Inventor: SWIM WILLIAM A , KELLOGG HARRY L
IPC: G01R31/02
CPC classification number: G01R31/022
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公开(公告)号:US2730661A
公开(公告)日:1956-01-10
申请号:US26652652
申请日:1952-01-15
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L
IPC: H02M1/02
CPC classification number: H02M1/02
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6.
公开(公告)号:US2523027A
公开(公告)日:1950-09-19
申请号:US13968150
申请日:1950-01-20
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L , BEDFORD BURNICE D
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公开(公告)号:US3222592A
公开(公告)日:1965-12-07
申请号:US24584262
申请日:1962-12-19
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L
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公开(公告)号:US2960647A
公开(公告)日:1960-11-15
申请号:US67129957
申请日:1957-07-11
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L
IPC: H03F9/04
CPC classification number: H03F9/04
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公开(公告)号:US2911582A
公开(公告)日:1959-11-03
申请号:US69765557
申请日:1957-11-20
Applicant: GEN ELECTRIC
Inventor: KELLOGG HARRY L
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公开(公告)号:US2634397A
公开(公告)日:1953-04-07
申请号:US29094452
申请日:1952-05-31
Applicant: GEN ELECTRIC
Inventor: BEDFORD BURNICE D , KELLOGG HARRY L
IPC: H02M1/02
CPC classification number: H02M1/02
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