公开(公告)号：US20170365047A1

公开(公告)日：2017-12-21

申请号：US15182952

申请日：2016-06-15

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Dirk Bequé ,  Florian Wiesinger

IPC: G06T7/00 ,  G06T5/00

CPC classification number: G06T5/005 ,  G06T2207/10081 ,  G06T2207/10088 ,  G06T2207/10104 ,  G06T2207/10108 ,  G06T2207/30168 ,  G16H30/20 ,  G16H30/40 ,  G16H40/63

Abstract: The system and method of the invention pertains to automated analysis and reconstruction of images from a plurality of imaging devices to determine the presence of different types of artifacts, using signal processing and machine learning algorithms. The method (1) classifies the artifacts according to their cause, (2) selects correction algorithms to address the artifact, or artifact-generating data, and (3) selects the data or sections of the data and/or reconstruction parameters to be corrected. Then, another reconstruction is performed with the selected artifact corrections, yielding a second reconstructed image with less artifact content. The process can be applied iteratively until the artifact content of the reconstructed image is reduced to a satisfactory low level as determined by a user. If the artifacts cannot be addressed by data processing means, the method initiates or recommends alternative artifact management actions.

公开(公告)号：US09706972B1

公开(公告)日：2017-07-18

申请号：US15278652

申请日：2016-09-28

Applicant: General Electric Company

Inventor： Sangtae Ahn ,  Lishui Cheng ,  Florian Wiesinger ,  Dirk Bequé ,  Sandeep Suryanarayana Kaushik ,  Dattesh Dayanand Shanbhag

IPC: G01T1/164 ,  A61B6/00 ,  G01T1/29 ,  G01T1/17 ,  A61B6/03 ,  A61B6/02 ,  G06T7/00 ,  G06T3/40 ,  G06T11/00

CPC classification number: A61B6/5235 ,  A61B6/025 ,  A61B6/032 ,  A61B6/037 ,  A61B6/4085 ,  A61B6/461 ,  A61B6/502 ,  A61B6/5205 ,  G01T1/1647 ,  G01T1/17 ,  G06T11/006 ,  G06T2211/424 ,  G06T2211/432

Abstract: Aspects of the invention relate to generating an emission activity image as well as an emission attenuation map using an iterative updation based on both the raw emission projection data and the raw radiography projection data, and an optimization function. The outputs include an optimized emission activity image, and at least one of an optimized emission attenuation map or an optimized radiography image. In some aspects an attenuated corrected emission activity image is obtained using the optimized emission activity image, and the optimized emission attenuation map.