公开(公告)号：US20160069672A1

公开(公告)日：2016-03-10

申请号：US14787134

申请日：2014-04-25

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Guangping XIE ,  Ming JIA ,  Zirong ZHAI ,  Paolo TRALLORI ,  Kevin George HARDING ,  Guiji SONG

IPC: G01B11/30

CPC classification number: G01B11/303 ,  G01B11/24 ,  G01B11/30 ,  G01B11/306 ,  G01N21/47 ,  G01N21/55

Abstract: A surface roughness measurement device that in one embodiment includes main and auxiliary emitting fibers, multiple collecting fibers, an optical housing, main and auxiliary reflective mirrors, and an external circuit. The optical housing includes the fibers and defines an aperture for optically contacting a surface of an object. The main reflective mirror is arranged in the optical housing, for reflecting light emitted from the main emitting fiber to a detecting point of the aperture and reflected light by the object to the collecting fibers. The auxiliary reflective mirror is arranged in the optical housing, for reflecting light emitted from the auxiliary emitting fiber to the detecting point. The external circuit is for generating a laser beam to the main and auxiliary emitting fibers, collecting the reflected light from the collecting fibers, and calculating the surface roughness of the object based on the collected reflected light.

Abstract translation: 在一个实施例中的表面粗糙度测量装置包括主发射光纤和辅助发射光纤，多个收集光纤，光学壳体，主和辅助反射镜以及外部电路。 光学壳体包括光纤并且限定用于光学地接触物体表面的孔。 主反射镜布置在光学壳体中，用于将从主发射光纤发射的光反射到孔的检测点，并将物体的反射光反射到收集光纤。 辅助反射镜布置在光学壳体中，用于将从辅助发射光纤发射的光反射到检测点。 外部电路用于对主发射光纤和辅助发射光纤产生激光束，收集来自收集光纤的反射光，并根据收集的反射光计算物体的表面粗糙度。