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1.发明申请公开(公告)号：US20230040179A1
公开(公告)日：2023-02-09
申请号：US17961605
申请日：2022-10-07
Applicant: General Electric Company
Inventor： Johannes Clemens SCHAB , Sophie Betty Claire DUVAL , Piero-Daniele GRASSO , Julien Rene Andre ZIMMERMANN , Norbert LUCKE
Abstract: A system for analyzing layer thickness of a multilayer component is provided. The system includes: an opening forming device configured to create an opening having a predefined geometry partially into the multilayer component at a selected location on a surface of the multilayer component, where the multilayer component includes a plurality of material layers including a substrate and a bond coat and the opening exposes each of the plurality of material layers, and an imaging device configured to create an image of the exposed plurality of material layers in the opening. The system is configured to calculate at least a thickness of the bond coat of the exposed plurality of material layers from the image and based on the predefined geometry of the opening. The system may also include a repairing device configured to repair the opening, allowing the multilayer component to be used for an intended purpose.
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2.发明申请公开(公告)号：US20230038239A1
公开(公告)日：2023-02-09
申请号：US17968889
申请日：2022-10-19
Applicant: General Electric Company
Inventor： Johannes Clemens SCHAB , Sophie Betty Claire DUVAL , Piero-Daniele GRASSO , Julien Rene Andre ZIMMERMANN , Norbert LUCKE , Selim Akin , Yusuf Eren Ozturk , Mustafa Yuvalaklioglu
Abstract: An automated system is provided. The system includes: a manipulator coupled to: an opening forming device configured to create an opening having a predefined geometry partially into a multilayer component at a selected location on a surface of the multilayer component, where the multilayer component includes a plurality of material layers including at least a substrate and a bond coat, and where the opening exposes each of the plurality of material layers; and an imaging device configured to create an image of the exposed plurality of material layers in the opening; and a processor configured to calculate at least a thickness of the bond coat of the exposed plurality of material layers from the image and based on the predefined geometry of the opening. Methods of using the system to analyze layer thickness of a multilayer component and repair a multilayer component are also provided.
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公开(公告)号：US20180209045A1
公开(公告)日：2018-07-26
申请号：US15622530
申请日：2017-06-14
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Dheepa SRINIVASAN , Raghupatruni PRASAD , Sophie Betty Claire DUVAL , Piero-Daniele GRASSO , Atifa ARIF
IPC: C23C16/56
Abstract: A process for forming an aluminide coating system on a substrate. The process includes preparing a slurry including, by weight, about 35 to about 65% of an aluminum donor powder, the aluminum donor material comprising at least 35% aluminum, about 1 to about 25% of a binder, and balance essentially carrier. The slurry is applied to the substrate. The substrate is a nickel or cobalt based superalloy being essentially free of aluminum. The slurry is heated to form an aluminide diffusion coating including an additive aluminide layer and an interdiffusion zone disposed between the substrate and the additive aluminide layer.
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4.发明申请公开(公告)号：US20200182608A1
公开(公告)日：2020-06-11
申请号：US16701243
申请日：2019-12-03
Applicant: General Electric Company
Inventor： Johannes Clemens SCHAB , Sophie Betty Claire DUVAL , Piero-Daniele GRASSO , Julien Rene Andre ZIMMERMANN , Norbert LUCKE
Abstract: A method of analyzing layer thickness of a multilayer component is provided. The method includes: creating an opening having a predefined geometry partially into the multilayer component at a selected location on a surface of the multilayer component. The multilayer component includes a plurality of material layers including a substrate and a bond coat. The opening exposes each of the plurality of material layers including the substrate. Contrast of the exposed plurality of material layers can be increased. An image is created of the exposed layers in the opening using a digital microscope, and thickness of a bond coat, thickness of a depletion layer\ and/or thickness of an oxide layer is calculated from the image and based on the predefined geometry of the opening. Repairing the opening, allows the multilayer component to be used for an intended purpose after testing, e.g., re-installed and reused in a gas turbine.
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