公开(公告)号：US09424381B2

公开(公告)日：2016-08-23

申请号：US13932662

申请日：2013-07-01

Applicant: GLOBALFOUNDRIES INC.

Inventor： Nagashyamala R. Dhanwada ,  David J. Hathaway ,  Victor Zyuban

IPC: G06F17/50

CPC classification number: G06F17/5036 ,  G06F2217/78

Abstract: A method for generating a power model for a device includes identifying a device-level set of power contributors for a given state of the device, wherein each power contributor in the device-level set of power contributors contributes to power dissipation when the device is in the given state, and generating the power model for the device based on the device-level set of power contributors, wherein the power model is independent of process, voltage, and temperature.

Abstract translation: 一种用于产生设备的功率模型的方法包括识别设备的给定状态的功率贡献者的设备级集合，其中设备级功率馈送组中的每个功率贡献者在设备处于 给定状态，并且基于功率贡献者的设备级集合来生成用于设备的功率模型，其中功率模型独立于过程，电压和温度。

公开(公告)号：US09519747B1

公开(公告)日：2016-12-13

申请号：US14751222

申请日：2015-06-26

Applicant: GLOBALFOUNDRIES INC.

Inventor： Nathan Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  David J. Hathaway ,  Jeffrey G. Hemmett ,  Kerim Kalafala ,  Gregory M. Schaeffer ,  Stephen G. Shuma ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Vladimir Zolotov

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G06F17/5018 ,  G06F17/5022 ,  G06F17/5031 ,  G06F17/5036 ,  G06F2217/84

Abstract: Methods and systems receive an integrated circuit design into a computerized device and perform an analysis of the integrated circuit design to identify characteristics of physical features of portions of the integrated circuit design. Such methods and systems determine whether to look up sensitivity of a timing value of a portion of the integrated circuit design to manufacturing process variables, voltage variables, and temperature variables (PVT variables) by: evaluating relationships between the characteristics of physical features of the portion of the integrated circuit design to generate an indicator value; and, based on whether the indicator value is within a table usage filter value range, either: calculating the sensitivity of the timing value to the PVT variables; or looking up a previously determined sensitivity of the timing value to the PVT variables from a look-up table.

Abstract translation: 方法和系统将集成电路设计接收到计算机化设备中，并对集成电路设计进行分析，以识别集成电路设计部分的物理特征的特征。 这样的方法和系统通过以下方式确定是否查看集成电路设计的一部分的定时值对制造过程变量，电压变量和温度变量（PVT变量）的敏感度：评估部分的物理特征的特性之间的关系 的集成电路设计生成指标值; 并且基于指标值是否在表使用过滤器值范围内，或者：计算定时值对PVT变量的灵敏度; 或从查找表中查找先前确定的定时值对PVT变量的敏感度。

公开(公告)号：US20160378903A1

公开(公告)日：2016-12-29

申请号：US14751222

申请日：2015-06-26

Applicant: GLOBALFOUNDRIES INC.

Inventor： Nathan Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  David J. Hathaway ,  Jeffrey G. Hemmett ,  Kerim Kalafala ,  Gregory M. Schaeffer ,  Stephen G. Shuma ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Vladimir Zolotov

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G06F17/5018 ,  G06F17/5022 ,  G06F17/5031 ,  G06F17/5036 ,  G06F2217/84

Abstract: Methods and systems receive an integrated circuit design into a computerized device and perform an analysis of the integrated circuit design to identify characteristics of physical features of portions of the integrated circuit design. Such methods and systems determine whether to look up sensitivity of a timing value of a portion of the integrated circuit design to manufacturing process variables, voltage variables, and temperature variables (PVT variables) by: evaluating relationships between the characteristics of physical features of the portion of the integrated circuit design to generate an indicator value; and, based on whether the indicator value is within a table usage filter value range, either: calculating the sensitivity of the timing value to the PVT variables; or looking up a previously determined sensitivity of the timing value to the PVT variables from a look-up table.

Abstract translation: 方法和系统将集成电路设计接收到计算机化设备中，并对集成电路设计进行分析，以识别集成电路设计部分的物理特征的特征。 这样的方法和系统通过以下方式确定是否查看集成电路设计的一部分的定时值对制造过程变量，电压变量和温度变量（PVT变量）的敏感度：评估部分的物理特征的特性之间的关系 的集成电路设计生成指标值; 并且基于指标值是否在表使用过滤器值范围内，或者：计算定时值对PVT变量的灵敏度; 或从查找表中查找先前确定的定时值对PVT变量的敏感度。