公开(公告)号：US10949005B2

公开(公告)日：2021-03-16

申请号：US16429702

申请日：2019-06-03

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Mustapha Slamani ,  Kaushal Kannan ,  Ritin Nambiar ,  Timothy M. Platt

IPC: H04B3/46 ,  G06F3/041 ,  H04L7/02 ,  G06F3/0484

Abstract: The present disclosure relates to a testing device and techniques of testing semiconductor structures and, more particularly, to an absolute phase measurement testing device and technique of testing semiconductor structures. The structure includes: a first frequency input source which provides a first signal to an up-converter at an input side of a test fixture; a down-converter on an output side of the test fixture; a second frequency signal source which provides a second signal at a higher frequency than the first signal to the up-converter and the down-converter on the output side of the test fixture; a bypass path which bypasses the test fixture and provides connection between the up-converter and the down-converter; and a digitizer that is connected to an output side of the down-converter.