公开(公告)号：US09859834B2

公开(公告)日：2018-01-02

申请号：US15016990

申请日：2016-02-05

Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC

Inventor： Xiujie Gao ,  Christopher B. Churchill ,  Guillermo A. Herrera ,  Andrew C. Keefe ,  Paul W. Alexander

IPC: H02K41/00 ,  H02P1/00 ,  H02P3/00 ,  H02P5/00 ,  H02P25/06 ,  F03G7/06

CPC classification number: H02P25/06 ,  F03G7/065

Abstract: A slack compensator includes a stator fixedly attachable to a base and a shuttle. The shuttle is selectably movable from a first position on the stator to a second position on the stator. The shuttle is selectably releasably attached to the stator in the first position. The shuttle is to be permanently captured upon reaching the second position. The slack compensator is attachable to an SMA wire for removing slack that develops in the SMA wire during a plurality of break-in cycles.

公开(公告)号：US09588020B2

公开(公告)日：2017-03-07

申请号：US14271118

申请日：2014-05-06

Applicant: GM Global Technology Operations LLC

Inventor： Alan L. Browne ,  Xiujie Gao ,  Nancy L. Johnson ,  Christopher B. Churchill ,  Guillermo A. Herrera ,  Geoffrey P. McKnight

IPC: F03G7/06 ,  G01M99/00

CPC classification number: G01M99/007 ,  F03G7/06 ,  F03G7/065 ,  G01M99/008 ,  G03B2205/0076

Abstract: A method of testing a shape memory alloy (SMA) actuated device includes cyclically operating the device. The method further includes determining a number of cycles in a functional life of the device based on observations of the device during the cyclical operation. The functional life is a range of consecutive cycles of operation of the device beginning with a first cycle during which the device performs within a specified limit. The functional life is immediately followed by a cycle during which the device performs outside of the specified limit. The method still further includes applying a progressive substitution sub-process to identify an opportunity to increase the number of cycles in the functional life of the device.

Abstract translation: 测试形状记忆合金（SMA）致动装置的方法包括循环地操作该装置。 该方法还包括基于在周期性操作期间设备的观察来确定设备的功能寿命中的周期数。 功能寿命是器件从指定限制内​​执行的第一个周期开始的连续操作循环的范围。 功能寿命紧随其后的是设备执行超出规定限制的周期。 该方法还包括应用逐行替换子过程来识别增加设备的功能寿命中的循环次数的机会。

公开(公告)号：US20150323424A1

公开(公告)日：2015-11-12

申请号：US14271118

申请日：2014-05-06

Applicant: GM Global Technology Operations LLC

Inventor： Alan L. Browne ,  Xiujie Gao ,  Nancy L. Johnson ,  Christopher B. Churchill ,  Guillermo A. Herrera ,  Geoffrey P. McKnight

IPC: G01M99/00

CPC classification number: G01M99/007 ,  F03G7/06 ,  F03G7/065 ,  G01M99/008 ,  G03B2205/0076

Abstract: A method of testing a shape memory alloy (SMA) actuated device includes cyclically operating the device. The method further includes determining a number of cycles in a functional life of the device based on observations of the device during the cyclical operation. The functional life is a range of consecutive cycles of operation of the device beginning with a first cycle during which the device performs within a specified limit. The functional life is immediately followed by a cycle during which the device performs outside of the specified limit. The method still further includes applying a progressive substitution sub-process to identify an opportunity to increase the number of cycles in the functional life of the device.

Abstract translation: 测试形状记忆合金（SMA）致动装置的方法包括循环地操作该装置。 该方法还包括基于在周期性操作期间设备的观察来确定设备的功能寿命中的周期数。 功能寿命是器件从指定限制内​​执行的第一个周期开始的连续操作循环的范围。 功能寿命紧随其后的是设备执行超出规定限制的周期。 该方法还包括应用逐行替换子过程来识别增加设备的功能寿命中的循环次数的机会。

公开(公告)号：US10527567B2

公开(公告)日：2020-01-07

申请号：US15359860

申请日：2016-11-23

Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC

Inventor： Alan L. Browne ,  Nancy L. Johnson ,  Paul W. Alexander ,  Geoffrey P. McKnight ,  Guillermo A. Herrera ,  Christopher B. Churchill ,  Andrew C. Keefe ,  Xiujie Gao

IPC: G01L1/00 ,  G01N25/02

Abstract: A method of testing a SMA element includes connecting the SMA element to a validation tool, and applying an electrical current to the SMA element over a test cycle. A resistance of the SMA element during the test cycle is measured, while the electrical current is being applied. The measured resistance of the SMA element during the test cycle is correlated to an estimated strain value of the SMA element during the test cycle. A temperature of the SMA element during the test cycle is estimated. A stress in the SMA element during the test cycle is estimated from a stress predicting grid, using the estimated strain value and the estimated temperature of the SMA element during the test cycle. The proper functionality of the SMA element may be determined based on the estimated stress in the SMA element.

公开(公告)号：US09091252B2

公开(公告)日：2015-07-28

申请号：US13688863

申请日：2012-11-29

Applicant: GM Global Technology Operations LLC

Inventor： Vidyashankar R. Buravalla ,  Shivaram Ac ,  Ashish Khandelwal ,  Christopher B. Churchill

IPC: F03G7/06

CPC classification number: F03G7/065

Abstract: An actuator comprising an SMA element and a thermally responsive element that adjusts bias stress improves high ambient temperature operation.

Abstract translation: 包括SMA元件和调节偏压应力的热响应元件的致动器改善了高环境温度操作。

公开(公告)号：US20180142999A1

公开(公告)日：2018-05-24

申请号：US15359860

申请日：2016-11-23

Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC

Inventor： Alan L. Browne ,  Nancy L. Johnson ,  Paul W. Alexander ,  Geoffrey P. McKnight ,  Guillermo A. Herrera ,  Christopher B. Churchill ,  Andrew C. Keefe ,  Xiujie Gao

IPC: G01B7/16 ,  G01N25/02

CPC classification number: G01N25/02 ,  G01M99/00

Abstract: A method of testing a SMA element includes connecting the SMA element to a validation tool, and applying an electrical current to the SMA element over a test cycle. A resistance of the SMA element during the test cycle is measured, while the electrical current is being applied. The measured resistance of the SMA element during the test cycle is correlated to an estimated strain value of the SMA element during the test cycle. A temperature of the SMA element during the test cycle is estimated. A stress in the SMA element during the test cycle is estimated from a stress predicting grid, using the estimated strain value and the estimated temperature of the SMA element during the test cycle. The proper functionality of the SMA element may be determined based on the estimated stress in the SMA element.

公开(公告)号：US20170229990A1

公开(公告)日：2017-08-10

申请号：US15016990

申请日：2016-02-05

Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC

Inventor： Xiujie Gao ,  Christopher B. Churchill ,  Guillermo A. Herrera ,  Andrew C. Keefe ,  Paul W. Alexander

IPC: H02P25/06 ,  F03G7/06

CPC classification number: H02P25/06 ,  F03G7/065

Abstract: A slack compensator includes a stator fixedly attachable to a base and a shuttle. The shuttle is selectably movable from a first position on the stator to a second position on the stator. The shuttle is selectably releasably attached to the stator in the first position. The shuttle is to be permanently captured upon reaching the second position. The slack compensator is attachable to an SMA wire for removing slack that develops in the SMA wire during a plurality of break-in cycles.