Abstract:
Certain example embodiments relate to light emitting diode (e.g., OLED and/or PLED) inclusive devices, and/or methods of making the same. Certain example embodiments incorporate an optical out-coupling layer stack (OCLS) structure that includes a vacuum deposited index matching layer (imL) provided over an organo-metallic scattering matrix layer. The imL may be a silicon-inclusive layer and may include, for example, vacuum deposited SiOxNy. The OCLS including scattering micro-particles, the imL, and the anode may be designed such that the device extraction efficiency is significantly improved, e.g., by efficiently coupling the light generated in the organic layers of the devices and extracted through the glass substrate. In certain example embodiments, the refractive index of the ITO, SiOxNy index matching layer, OCLS scattering layer and the glass substrate may be provided in decreasing order.
Abstract translation:某些示例实施例涉及包含发光二极管(例如,OLED和/或PLED)的设备,和/或制造它们的方法。 某些示例性实施例包括光学输出耦合层堆叠(OCLS)结构,其包括在有机金属散射矩阵层上提供的真空沉积折射率匹配层(imL)。 imL可以是含硅的层,并且可以包括例如真空沉积的SiO x N y。 可以设计包括散射微粒子,imL和阳极的OCLS,使得器件提取效率显着提高,例如通过有效地耦合在器件的有机层中产生的光并通过玻璃衬底提取。 在某些示例性实施例中,可以以降序的顺序提供ITO,SiOxNy折射率匹配层,OCLS散射层和玻璃基板的折射率。
Abstract:
Certain example embodiments relate to organic light emitting diode (OLED)/polymer light emitting diode (PLED) devices, and/or methods of making the same. A first transparent conductive coating (TCC) layer is disposed, directly or indirectly, on a glass substrate. An outermost major surface of the TCC layer is planarized by exposing the outermost major surface thereof to an ion beam. Following said planarizing, the first TCC layer has an arithmetic mean value RMS roughness (Ra) of less than 1.5 nm. A hole transporting layer (HTL) and an electron transporting and emitting layer (ETL) are disposed, directly or indirectly, on the planarized outermost major surface of the first TCC layer. A second TCC layer is disposed, directly or indirectly, on the HTL and the ETL. One or both TCC layers may include ITO. The substrate and/or an optional optical out-coupling layer stack system may be planarized using an ion beam.