X-RAY PHASE-CONTRAST IMAGING
    2.
    发明申请
    X-RAY PHASE-CONTRAST IMAGING 有权
    X射线相位成像

    公开(公告)号:US20160135769A1

    公开(公告)日:2016-05-19

    申请号:US14943157

    申请日:2015-11-17

    IPC分类号: A61B6/00 G06T11/00 G06T7/00

    摘要: Systems and methods for X-ray phase-contrast imaging (PCI) are provided. A quasi-periodic phase grating can be positioned between an object being imaged and a detector. An analyzer grating can be disposed between the phase grating and the detector. Second-order approximation models for X-ray phase retrieval using paraxial Fresnel-Kirchhoff diffraction theory are also provided. An iterative method can be used to reconstruct a phase-contrast image or a dark-field image.

    摘要翻译: 提供了X射线相位对比成像(PCI)的系统和方法。 准周期相位光栅可以位于被成像对象和检测器之间。 分析器光栅可以设置在相位光栅和检测器之间。 还提供了使用近轴菲涅尔 - 基尔霍夫衍射理论的X射线相位检索的二阶近似模型。 可以使用迭代方法来重建相位对比度图像或暗视场图像。