公开(公告)号：US11817669B2

公开(公告)日：2023-11-14

申请号：US17532834

申请日：2021-11-22

Applicant: Robert R. Alfano

Inventor： Robert R. Alfano ,  Shah Faisal B. Mazhar ,  Mikhail Sharonov ,  Lingyan Shi

IPC: H01S3/10 ,  H01S3/00 ,  H01S3/1106 ,  H01S3/108 ,  H01S3/107 ,  H01S5/00 ,  G21K7/00 ,  A61B6/00 ,  G02F1/35

CPC classification number: H01S3/0092 ,  H01S3/0057 ,  H01S3/0085 ,  H01S3/107 ,  H01S3/108 ,  H01S3/1106 ,  H01S3/1121 ,  H01S5/0085 ,  A61B6/484 ,  G02F1/3528 ,  G21K7/00 ,  G21K2207/005

Abstract: In this patent, we teach methods to generate coherent X-ray and UUV rays beams for X ray and UUV microscopes using intense femtosecond pulses resulting the Ultra-Supercontinuum (USC) and Higher Harmonic Generation (HHG) from χ3 and χ5 media produce from electronic and molecular Kerr effect. The response of n2 (χ3) and n4 (χ5) at the optical frequency from instantaneously response of carrier phase of envelope results in odd HHG and spectral broadening about each harmonic on the anti-Stokes side of the pump pulse at wo typically in the visible, NIR, and MIR. From the slower molecular Kerr response on femtosecond to picosecond from orientation and molecular motion on n2 and n4 which follow the envelope of optical field of the laser gives rise to extreme broadening without HHG. The resulting spectra extend on the Stokes side towards the IR, RF to DC covering most of the electromagnetic spectrum. These HHG and Super broadening covering UUV to X rays and possibly to gamma ray regime for microscopes.

公开(公告)号：US10074451B2

公开(公告)日：2018-09-11

申请号：US15235173

申请日：2016-08-12

Applicant: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A.-RECHERCHE ET DEVELOPPEMENT

Inventor： Christian Kottler ,  Vincent Revol

IPC: G21K1/06 ,  G01N23/20 ,  G02B5/18 ,  G02B27/42 ,  G01N23/20008 ,  G02B27/00 ,  A61B6/00 ,  A61B6/06

CPC classification number: G21K1/067 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4291 ,  A61B6/484 ,  A61B6/588 ,  A61B6/589 ,  G01N23/20008 ,  G01N23/20075 ,  G01N2223/1003 ,  G01N2223/313 ,  G02B5/1814 ,  G02B5/1819 ,  G02B5/1838 ,  G02B5/1871 ,  G02B27/0087 ,  G02B27/42 ,  G02B2005/1804 ,  G21K1/06 ,  G21K2201/067 ,  G21K2207/005

Abstract: Embodiments relate to an X-ray interferometer for imaging an object comprising: a phase grating for effecting in correspondence with the phase grating geometry a phase shift to at least a part of X-ray incident onto the phase grating; and an absorption grating for effecting in correspondence with the absorption grating geometry absorption to at least a part of X-ray incident onto the absorption grating. The grating period of the phase grating, and the grating period of the absorption grating may be dimensioned such that a detector for X-rays can be placed at a relatively large distance away from the absorption grating such the phase contrast sensitivity of the image of the object detected by the detector remains substantially unaffected.

公开(公告)号：US20180226167A1

公开(公告)日：2018-08-09

申请号：US15890376

申请日：2018-02-07

Applicant: Shimadzu Corporation

Inventor： Takahiro DOKI ,  Yukihisa WADA ,  Satoshi TOKUDA ,  Nobukazu HAYASHI ,  Toshinori YOSHIMUTA

IPC: G21K1/06 ,  G01B15/00

CPC classification number: G21K1/062 ,  G01B15/00 ,  G21K1/025 ,  G21K1/06 ,  G21K2207/005

Abstract: The method of producing this diffraction grating includes a step of generating a moire by a periodic pattern projected onto a plurality of unit diffraction gratings and a plurality of unit diffraction gratings, and a step of adjusting so that the extending directions of the gratings are aligned by relatively rotating at least one of a plurality of unit diffractions with respect to at least one of the others of the plurality of unit diffractions.

公开(公告)号：US20180192981A1

公开(公告)日：2018-07-12

申请号：US15741047

申请日：2016-07-27

Applicant: Rensselaer Polytechnic Institute

Inventor： Ge Wang ,  Wenxiang Cong

IPC: A61B6/00

CPC classification number: A61B6/484 ,  A61B6/032 ,  A61B6/4007 ,  A61B6/4021 ,  A61B6/4028 ,  A61B6/4035 ,  A61B6/405 ,  A61B6/4064 ,  A61B6/4225 ,  A61B6/4233 ,  A61B6/4241 ,  A61B6/4291 ,  G21K2207/005 ,  H01J29/488 ,  H01J35/14

Abstract: Novel and advantageous systems and methods for performing X-ray imaging by using an X-ray source with source grating functionality incorporated therein are provided. An electron beam can be electromagnetically manipulated such that the X-ray source emits radiation in a pattern that is the same as if the radiation had already passed through a source grating.

公开(公告)号：US20180180558A1

公开(公告)日：2018-06-28

申请号：US15717191

申请日：2017-09-27

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Taro SHIRAI ,  Takahiro DOKI ,  Akira HORIBA

IPC: G01N23/04

CPC classification number: G01N23/04 ,  G01N23/041 ,  G01N2223/1016 ,  G01N2223/401 ,  G01N2223/605 ,  G01N2223/6462 ,  G21K1/067 ,  G21K2207/005

Abstract: This X-ray phase imaging apparatus includes an X-ray source, a detector, a plurality of gratings including a phase grating and an absorption grating, and an image processing unit for generating an image including a dark field image. The image processing unit generates an image including a dark field image from an image captured by placing the plurality of gratings at one or two predetermined positions.

公开(公告)号：US20180172607A1

公开(公告)日：2018-06-21

申请号：US15704345

申请日：2017-09-14

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Taro SHIRAI ,  Takahiro DOKI ,  Akira HORIBA

IPC: G01N23/04 ,  G01N23/207 ,  G21K1/06

CPC classification number: G01N23/046 ,  G01N23/041 ,  G01N23/207 ,  G01N2223/419 ,  G21K1/067 ,  G21K2207/005

Abstract: The X-ray phase imaging apparatus is configured to include an image generation unit that generates an X-ray phase-contrast image based on a phase-contrast between a step curve representing an intensity change of an X-ray when an object is placed between an X-ray source and a phase grating or between a phase grating and an absorption grating and a step curve when no object is placed therebetween, and is configured to obtain a displacement amount of relative positions of a plurality of gratings based on a plurality of step curves.

公开(公告)号：US09970119B2

公开(公告)日：2018-05-15

申请号：US15031598

申请日：2014-10-02

Applicant: KONICA MINOLTA, INC.

Inventor： Mitsuru Yokoyama

IPC: A61B6/00 ,  G01N23/00 ,  C25D1/00 ,  C25D5/02 ,  C25D7/00 ,  C25D7/12 ,  G01T7/00 ,  G02B5/18 ,  G21K1/06 ,  C25D5/10 ,  C25D5/48 ,  G01N23/205 ,  A61B6/06

CPC classification number: C25D1/00 ,  A61B6/00 ,  A61B6/06 ,  A61B6/40 ,  A61B6/484 ,  C25D1/003 ,  C25D5/02 ,  C25D5/10 ,  C25D5/48 ,  C25D7/00 ,  C25D7/12 ,  G01N23/205 ,  G01T7/00 ,  G02B5/18 ,  G02B5/1838 ,  G02B5/1857 ,  G21K1/06 ,  G21K2207/005

Abstract: In one aspect, the present invention provides a curved grating structure manufacturing method which comprises: a grating forming step of forming, in one surface of a grating-forming workpiece, a grating region in which a plurality of members mutually having the same shape are periodically provided; a stress layer forming step of forming a stress layer capable of generating stress, on a grating plane-defining surface of the grating region; a boding step of bonding a support substrate to the stress layer; a polishing step of polishing the other surface of the grating-forming workpiece on a side opposite to the one surface having the support substrate bonded thereto; and a peeling step of peeling off the support substrate from the stress layer, wherein the polishing step includes performing the polishing to allow the grating-forming workpiece to be curved by a stress arising from the stress layer, after the peeling step.

公开(公告)号：US20180075938A1

公开(公告)日：2018-03-15

申请号：US15802473

申请日：2017-11-03

Applicant: Tsinghua University ,  Nuctech Company Limited

Inventor： Li ZHANG ,  Mingzhi HONG ,  Qingping HUANG ,  Le SHEN

IPC: G21K1/06 ,  G02B5/18

CPC classification number: G21K1/06 ,  G02B5/1838 ,  G21K1/025 ,  G21K2201/067 ,  G21K2207/005

Abstract: The disclosure relates to a grating and a radiation imaging device. The grating comprises a plurality of stacked grating elements. The grating elements are stacked to form a grid. The grating element comprises a first sheet and a second sheet having two parallel planes. The second sheet is stacked at the first sheet in a length direction of the first sheet. The first sheet is almost impervious to radiation. The present disclosure stacks the sheets having different specifications together to form the grating with uniform grating slits, such that there is no limitation on the thickness of the grating and the grating can be used along with high-energy radiations.

公开(公告)号：US20180035961A1

公开(公告)日：2018-02-08

申请号：US15671586

申请日：2017-08-08

Applicant: SIEMENS HEALTHCARE GMBH

Inventor： PETER BARTL ,  MARCUS RADICKE ,  LUDWIG RITSCHL ,  SVEN-MARTIN SUTTER ,  THOMAS WEBER ,  MARTINO LEGHISSA ,  JOSEF ZEIDLER

IPC: A61B6/00 ,  G01J3/18 ,  G01N23/20 ,  A61B6/08 ,  G03B42/02

CPC classification number: A61B6/484 ,  A61B6/0407 ,  A61B6/08 ,  A61B6/4291 ,  G01J3/1833 ,  G01J2003/1842 ,  G01N23/20 ,  G03B42/02 ,  G21K2207/005

Abstract: A mobile grating-detector arrangement has an X-ray detector and at least one grating. The grating-detector arrangement is configured to record an interferometric X-ray image of at least one body part of a patient in a patient bed in operation. In addition, an X-ray system with such a grating-detector arrangement and its use for X-ray interferometric imaging is described.

公开(公告)号：US09842414B2

公开(公告)日：2017-12-12

申请号：US14907084

申请日：2014-07-23

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Thomas Koehler ,  Ewald Roessl ,  Dirk Schafer

IPC: G06K9/00 ,  G06T11/00 ,  A61B6/00 ,  G01N23/20 ,  G01N23/04 ,  A61B6/03

CPC classification number: G06T11/005 ,  A61B6/032 ,  A61B6/4035 ,  A61B6/4241 ,  A61B6/4291 ,  A61B6/461 ,  A61B6/467 ,  A61B6/484 ,  A61B6/5205 ,  A61B6/5235 ,  G01N23/046 ,  G01N23/20075 ,  G01N2223/045 ,  G01N2223/423 ,  G06T2207/10081 ,  G06T2207/10124 ,  G06T2207/30008 ,  G21K2207/005

Abstract: The present invention relates to a method and apparatus for X-ray phase contrast imaging. The method comprises the following steps: from the measured phase gradient and overall attenuation information, an electron density is computed; the contribution pc of the Compton scattering to the overall attenuation is estimated from the electron density; the contribution pp of the photo-electric absorption to the overall attenuation is estimated from the overall attenuation and the contribution pc; the values pc and pp are used to reconstruct a Compton image and a photo-electric image; by linear combination of these two images, a monochromatic image at a desired energy is obtained.