公开(公告)号：US12263636B2

公开(公告)日：2025-04-01

申请号：US17086983

申请日：2020-11-02

Applicant: General Electric Company

Inventor： Scott Alan Gold ,  John Poland

IPC: B29C64/165 ,  B29C64/268 ,  B29C64/393 ,  B33Y10/00 ,  B33Y50/02 ,  B33Y30/00

Abstract: Systems and methods for optical based monitoring of additive manufacturing processes are provided. In one example a method includes obtaining optical data representing a layer of a structure being manufactured using an additive manufacturing process, comparing the optical data with a standard optical representation associated with the structure, determining one or more nonconformance conditions between the optical data representing the layer and the standard optical representation, and implementing a control action based at least in part on the one or more nonconformance conditions.

公开(公告)号：US20220134647A1

公开(公告)日：2022-05-05

申请号：US17086983

申请日：2020-11-02

Applicant: General Electric Company

Inventor： Scott Alan Gold ,  John Poland

IPC: B29C64/165 ,  B29C64/268 ,  B29C64/393 ,  B33Y50/02

Abstract: Systems and methods for optical based monitoring of additive manufacturing processes are provided. In one example a method includes obtaining optical data representing a layer of a structure being manufactured using an additive manufacturing process, comparing the optical data with a standard optical representation associated with the structure, determining one or more nonconformance conditions between the optical data representing the layer and the standard optical representation, and implementing a control action based at least in part on the one or more nonconformance conditions.