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公开(公告)号:US20200147889A1
公开(公告)日:2020-05-14
申请号:US16184481
申请日:2018-11-08
Applicant: General Electric Company
Inventor: Voramon Supatarawanich DHEERADHADA , Natarajan CHENNIMALAI KUMAR , Vipul Kumar GUPTA , Laura DIAL , Anthony Joseph VINCIQUERRA , Timothy HANLON
IPC: B29C64/393 , B29C64/10 , G06F17/50 , G06K9/62 , G06N20/00
Abstract: Methods and systems for optimizing additive process parameters for an additive manufacturing process. In some embodiments, the process includes receiving initial additive process parameters, generating an uninformed design of experiment utilizing a specified sampling protocol, next generating, based on the uninformed design of experiment, response data, and then generating, based on the response data and on previous design of experiment that includes at least one of the uninformed design of experiment and informed design of experiment, an informed design of experiment by using the machine learning model and the intelligent sampling protocol. The last process step is repeated until a specified objective is reached or satisfied.
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2.
公开(公告)号:US20180121170A1
公开(公告)日:2018-05-03
申请号:US15338839
申请日:2016-10-31
Applicant: General Electric Company
Inventor: Arun Karthi SUBRAMANIYAN , John LAZOS , Natarajan CHENNIMALAI KUMAR , Alexandre IANKOULSKI , Renato Giorgiani Do NASCIMENTO
Abstract: According to some embodiments, system, apparatus and methods are provided comprising one or more component models of an analytic model for an installed product; an application programming interface (API) wrapper associated with each of the one or more component models, the API wrapper including information about one or more inputs to the component model; and wherein the component model and the API wrapper form a self-aware component. Numerous other aspects are provided.
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3.
公开(公告)号:US20200265325A1
公开(公告)日:2020-08-20
申请号:US16791654
申请日:2020-02-14
Applicant: GENERAL ELECTRIC COMPANY
Inventor: Alfredo GABALDON ROYVAL , Natarajan CHENNIMALAI KUMAR
IPC: G06N5/02 , G06F16/36 , G06F16/901 , G06F16/903
Abstract: A system, method, and computer-readable medium, to receive a query to execute against a knowledge graph, the knowledge graph representing information pertaining to a particular scientific domain and the query including at least one variable represented by the knowledge graph; examining the knowledge graph to identify variables therein that are also specified in the query; generate a scientific model based on the query and the identified variables in the knowledge graph the execution of the model providing an answer to the query; and transmitting a record of the generated model to a data store and persisting the record in the data store.
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4.
公开(公告)号:US20230029806A1
公开(公告)日:2023-02-02
申请号:US17967391
申请日:2022-10-17
Applicant: General Electric Company
Inventor: Vipul Kumar GUPTA , Natarajan CHENNIMALAI KUMAR , Anthony Joseph VINCIQUERRA , Laura Cerully DIAL , Voramon Supatarawanich DHEERADHADA , Timothy HANLON , Lembit SALASOO , Xiaohu PING , Subhrajit ROYCHOWDHURY , Justin John GAMBONE
IPC: B29C64/393 , B22F10/20 , B29C64/153 , B22F10/30 , B22F3/24 , B33Y30/00 , B33Y10/00 , B33Y50/02 , B33Y40/00
Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.
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5.
公开(公告)号:US20200298499A1
公开(公告)日:2020-09-24
申请号:US16360180
申请日:2019-03-21
Applicant: General Electric Company
Inventor: Vipul Kumar GUPTA , Natarajan CHENNIMALAI KUMAR , Anthony Joseph VINCIQUERRA , Laura Cerully DIAL , Voramon Supatarawanich DHEERADHADA , Timothy HANLON , Lembit SALASOO , Xiaohu PING , Subhrajit ROYCHOWDHURY , Justin John GAMBONE
IPC: B29C64/393 , B22F3/105 , B29C64/153
Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.
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