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1.发明申请X-RAY DIFFRACTION DEVICES AND METHOD FOR ASSEMBLING AN OBJECT IMAGING SYSTEM 审中-公开X射线衍射装置和组装对象成像系统的方法公开(公告)号：US20110064197A1
公开(公告)日：2011-03-17
申请号：US12561117
申请日：2009-09-16
IPC分类号： G01N23/20
CPC分类号： G01N23/20008
摘要： A multiple-plane X-ray diffraction imaging (XDI) device for generating an X-ray diffraction (XRD) profile of an object is described. The XDI device includes an X-ray source configured to generate X-rays and a first primary collimator configured to generate a first primary X-ray fan-beam. The XDI device also includes a second primary collimator configured to generate a second primary X-ray fan-beam. The XDI device also includes a first scatter detector array configured to detect a first set of scattered radiation generated upon intersection of the first primary X-ray fan-beam with the object, and a second scatter detector array configured to detect a second set of scattered radiation generated upon intersection of the second primary X-ray fan-beam with the object.
摘要翻译： 描述用于产生物体的X射线衍射（XRD）轮廓的多平面X射线衍射成像（XDI）装置。 XDI装置包括被配置为产生X射线的X射线源和被配置为产生第一主X射线扇形束的第一主准直器。 XDI设备还包括被配置为产生第二主X射线扇形束的第二主准直器。 XDI设备还包括第一散射检测器阵列，其被配置为检测在与第一主X射线扇形光束与物体交叉时产生的第一组散射辐射，以及第二散射检测器阵列，被配置为检测第二组散射 在第二主X射线扇形光束与物体相交时产生的辐射。
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公开(公告)号：US20100329424A1
公开(公告)日：2010-12-30
申请号：US12494810
申请日：2009-06-30
IPC分类号： G01N23/20 , G01N23/201
CPC分类号： G01N23/20 , G01N2223/637 , G01N2223/639
摘要： A method for operating an X-ray diffraction imaging (XDI) system to scan an object includes generating an X-ray beam from at least one source focus at a first focus location, and receiving first scatter radiation at a first scatter angle at a scatter detector. The first scatter radiation is produced when the X-ray beam interacts with the object. The method further includes displacing the at least one source focus from the first focus location to a second focus location, generating a displaced X-ray beam from the at least one source focus at the second focus location, and receiving second scatter radiation at a second scatter angle at the scatter detector. The second scatter radiation is produced when the displaced X-ray beam interacts with the object. An identification of the object based on one of the first scatter radiation and the second scatter radiation is output.
摘要翻译： 用于操作X射线衍射成像（XDI）系统以扫描对象的方法包括在第一焦点位置从至少一个源焦点生成X射线束，并以散射角以第一散射角接收第一散射辐射 探测器。 当X射线束与物体相互作用时产生第一散射辐射。 所述方法还包括将所述至少一个源焦点从所述第一焦点位置移位到第二焦点位置，在所述第二焦点位置处从所述至少一个源焦点产生位移的X射线束，以及在所述第二焦点位置处接收第二散射辐射 在散射检测器处的散射角。 当移位的X射线束与物体相互作用时产生第二散射辐射。 输出基于第一散射辐射和第二散射辐射之一的对象的识别。
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公开(公告)号：US08139717B2
公开(公告)日：2012-03-20
申请号：US12572938
申请日：2009-10-02
IPC分类号： G21K1/02
CPC分类号： G21K1/025
摘要： A method for making a secondary collimator that includes at least one plate having a plurality of slits defined therein includes determining a gap thickness between plate positions of the secondary collimator based on at least one dimension of the at least one plate and fabricating a base plate from a base plate blank. The base plate includes at least two slots being spaced apart by the gap thickness. The at least one plate is inserted into a first slot of the at least two slots to form the secondary collimator.
摘要翻译： 一种用于制造二次准直器的方法，包括至少一个具有限定在其中的多个狭缝的板，包括：根据至少一个板的至少一个尺寸确定次准准器的板位置之间的间隙厚度，并从 底板坯。 基板包括至少两个狭槽间隔开的间隙厚度。 将至少一个板插入至少两个槽的第一槽中以形成次准准器。
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公开(公告)号：US20110081004A1
公开(公告)日：2011-04-07
申请号：US12572938
申请日：2009-10-02
IPC分类号： G21K1/02
CPC分类号： G21K1/025
摘要： A method for making a secondary collimator that includes at least one plate having a plurality of slits defined therein includes determining a gap thickness between plate positions of the secondary collimator based on at least one dimension of the at least one plate and fabricating a base plate from a base plate blank. The base plate includes at least two slots being spaced apart by the gap thickness. The at least one plate is inserted into a first slot of the at least two slots to form the secondary collimator.
摘要翻译： 一种用于制造二次准直器的方法，包括至少一个具有限定在其中的多个狭缝的板，包括：根据至少一个板的至少一个尺寸确定次准准器的板位置之间的间隙厚度，并从 底板坯。 基板包括至少两个狭槽间隔开的间隙厚度。 将至少一个板插入至少两个槽的第一槽中以形成次准准器。
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