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公开(公告)号:US11782174B2
公开(公告)日:2023-10-10
申请号:US17625206
申请日:2020-07-10
摘要: A radiation detector (100) includes an insulating substrate (110), which includes a material that undergoes a change in an electrical property when subjected to ionizing radiation. A conductive film (112) is disposed in relation to a surface of the substrate. The conductive film (112) has a resistance that is a function of a state of the electrical property. A resistance measuring device measures resistance across the conductive film (112). The resistance measured by the resistance measuring device indicates an amount of ionizing radiation to which the substrate (110) has been subjected. In a method of determining exposure to a type of radiation, a boron nitride substrate is exposed to a radiation environment. A resistance is measured across a conductive film disposed in relation to the boron nitride substrate. Radiation exposure is calculated as a function of the resistance.
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公开(公告)号:US20220365233A1
公开(公告)日:2022-11-17
申请号:US17625206
申请日:2020-07-10
摘要: A radiation detector (100) includes an insulating substrate (110), which includes a material that undergoes a change in an electrical property when subjected to ionizing radiation. A conductive film (112) is disposed in relation to a surface of the substrate. The conductive film (112) has a resistance that is a function of a state of the electrical property. A resistance measuring device measures resistance across the conductive film (112). The resistance measured by the resistance measuring device indicates an amount of ionizing radiation to which the substrate (110) has been subjected. In a method of determining exposure to a type of radiation, a boron nitride substrate is exposed to a radiation environment. A resistance is measured across a conductive film disposed in relation to the boron nitride substrate. Radiation exposure is calculated as a function of the resistance.
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