公开(公告)号：US20120116689A1

公开(公告)日：2012-05-10

申请号：US13252731

申请日：2011-10-04

申请人： Gerd Heinje ,  Rainer Jaeger

发明人： Gerd Heinje ,  Rainer Jaeger

IPC分类号： G06F19/00

CPC分类号： G06F19/707 ,  G06F19/708 ,  G06T11/206

摘要： A device (100) for analyzing measurement data having a plurality of data sets (206), each data set (206) being assigned to a respective one of a plurality of measurements, each data set (206) having multiple features (208) being indicative of different fractions of a fluidic sample, the device (100) comprising a cluster determining unit (108) configured for determining feature clusters (350) by clustering features (208) from different data sets (206) presumably relating to the same fraction, a spread determining unit (110) configured for determining for at least a part of the feature clusters (350) a spread (352) of the features (208) within a respective feature cluster (350), and a display unit (112) configured for displaying at least the part of the feature clusters (350) together with a graphical indication of the corresponding spread (352).

摘要翻译： 一种用于分析具有多个数据集（206）的测量数据的装置（100），每个数据组（206）被分配给多个测量中的相应一个，每个数据组（206）具有多个特征（208） 指示流体样本的不同分数，所述设备（100）包括：群集确定单元（108），其被配置为通过从可能与相同分数相关的不同数据集（206）聚类特征（208）来确定特征群集（350） 扩展确定单元（110），被配置用于确定特征群集（350）的至少一部分（350）各个特征集群（350）内的特征（208）的扩展（352）;以及配置 用于将特征簇（350）的至少一部分与对应扩展（352）的图形指示一起显示。

公开(公告)号：US09792416B2

公开(公告)日：2017-10-17

申请号：US13252731

申请日：2011-10-04

申请人： Gerd Heinje ,  Rainer Jaeger

发明人： Gerd Heinje ,  Rainer Jaeger

IPC分类号： G06F19/00 ,  G06T11/20

CPC分类号： G06F19/707 ,  G06F19/708 ,  G06T11/206

摘要： A device for analyzing measurement data having a plurality of data sets, each data set being assigned to a respective one of a plurality of measurements, each data set having multiple features being indicative of different fractions of a fluidic sample, the device comprising a cluster determining unit configured for determining feature clusters by clustering features from different data sets presumably relating to the same fraction, a spread determining unit configured for determining for at least a part of the feature clusters a spread of the features within a respective feature cluster, and a display unit configured for displaying at least the part of the feature clusters together with a graphical indication of the corresponding spread.

公开(公告)号：US20070112534A1

公开(公告)日：2007-05-17

申请号：US11219184

申请日：2005-09-02

申请人： Rainer Jaeger

发明人： Rainer Jaeger

IPC分类号： G01R35/00

CPC分类号： G01N30/8665 ,  G01N30/8624 ,  G01N30/8631 ,  G01N30/8668

摘要： A method for calibrating a sample peak pattern comprises aligning at least one second reference peak of the first calibration peak pattern with at least one corresponding second reference peak of the second calibration peak pattern, and performing an interpolation of the respective positions of the first reference peak in the first and the second calibration peak pattern, in order to derive a time dependence of the first reference peak's position. The method further comprises aligning the sample peak pattern relative to at least one of the calibration peak patterns in a way that the sample peak pattern's first reference peak is aligned with an interpolated position of the first reference peak according to the time dependence, and that at least one of the sample peak pattern's second reference peaks is aligned with at least one corresponding second reference peak of one of the calibration peak patterns.

摘要翻译： 用于校准样本峰图案的方法包括将第一校准峰图案的至少一个第二参考峰与第二校准峰图案的至少一个对应的第二参考峰对准，并且执行第一参考峰的各个位置的内插 在第一和第二校准峰值图案中，以便导出第一参考峰位置的时间依赖性。 所述方法还包括使样本峰图案相对于校准峰图案中的至少一个以使得样品峰图案的第一参考峰与第一参考峰的内插位置对准的方式对准，根据时间依赖性， 样本峰图案的第二参考峰中的至少一个与校准峰图案之一的至少一个相应的第二参考峰对准。

公开(公告)号：US07574328B2

公开(公告)日：2009-08-11

申请号：US11299160

申请日：2005-12-09

申请人： Rainer Jaeger

发明人： Rainer Jaeger

IPC分类号： G06F15/00

CPC分类号： G06K9/00536

摘要： Determining a property of a measured peak pattern having at least one peak includes extracting measured peak parameters from the measured peak pattern, and determining deviations of the measured peak parameters from reference values of a reference peak pattern. The reference peak pattern is represented by a spring model, with peak parameters being represented by corresponding springs. Determining a property of a measured peak pattern also includes determining a deformation energy necessary for deforming the reference peak pattern in a way that the deformed reference peak pattern substantially represents the measured peak pattern.

摘要翻译： 确定具有至少一个峰值的测量峰值图案的性质包括从测量的峰值图案中提取测量的峰值参数，以及根据参考峰图案的参考值确定所测量的峰值参数的偏差。 参考峰图案由弹簧模型表示，峰值参数由相应的弹簧表示。 确定测量的峰值图案的性质还包括确定变形能量，以使变形的基准峰图案基本上表示所测量的峰图案的方式使参考峰图案变形。

公开(公告)号：US20060126065A1

公开(公告)日：2006-06-15

申请号：US11299160

申请日：2005-12-09

申请人： Rainer Jaeger

发明人： Rainer Jaeger

IPC分类号： G01N21/00

CPC分类号： G06K9/00536

摘要： Determining a property of a measured peak pattern comprising at least one peak is described. The method comprises extracting measured peak parameters from the measured peak pattern, and of determining deviations of the measured peak parameters from reference values of a reference peak pattern. Said reference peak pattern is represented by a spring model, with peak parameters being represented by corresponding springs. The method further comprises determining a deformation energy necessary for deforming the reference peak pattern in a way that the deformed reference peak pattern substantially represents the measured peak pattern.

摘要翻译： 描述了确定包含至少一个峰的测量峰图案的性质。 该方法包括从测量的峰值图案中提取测量的峰值参数，以及根据参考峰图案的参考值确定所测量的峰值参数的偏差。 所述参考峰图案由弹簧模型表示，峰值参数由相应的弹簧表示。 该方法还包括确定使变形的参考峰图案基本上表示测量的峰图案的方式使参考峰图案变形所需的变形能。