Lift wall for a tube mill
    1.
    发明授权
    Lift wall for a tube mill 有权
    用于管磨机的提升墙

    公开(公告)号:US07168645B2

    公开(公告)日:2007-01-30

    申请号:US10343753

    申请日:2002-06-04

    IPC分类号: B02C17/06

    CPC分类号: B02C17/1855 B02C17/06

    摘要: A lifting wall for a tube mill which has a discharge means with lifting vanes in order to transport the material being ground to discharge openings by the rotary movement of the tube mill. The lifting vanes are disposed obliquely with respect to the radial direction so that the material being ground slides promptly to the center where it is discharged through the discharge openings still below the horizontal longitudinal central plane of the tube mill. The lifting vanes are substantially flat and bent like blades in a region of the discharge openings.

    摘要翻译: 用于管式研磨机的提升壁,其具有带有提升叶片的排出装置,以便通过管式磨机的旋转运动将被研磨的材料输送到排放口。 提升叶片相对于径向方向倾斜地设置,使得被研磨的材料迅速地移动到中心,在那里它通过仍然在管磨机的水平纵向中心平面下方的排出口排出。 提升叶片基本上平坦,并且在排出口的区域中像叶片一样弯曲。

    Method for examining an object using a microscope with delayed control signals and a microscope for examining an object
    2.
    发明授权
    Method for examining an object using a microscope with delayed control signals and a microscope for examining an object 有权
    使用具有延迟控制信号的显微镜检查物体的方法和用于检查物体的显微镜

    公开(公告)号:US08735790B2

    公开(公告)日:2014-05-27

    申请号:US12954629

    申请日:2010-11-25

    IPC分类号: G02B7/04 G02B27/40 G02B27/64

    CPC分类号: G02B21/0032

    摘要: A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.

    摘要翻译: 用于检查物体的显微镜包括产生脉冲光以激发物体的激光光源。 包括检测器的测量系统适于检测来自物体的检测光,并且测量系统基于检测光产生测量信号。 显微镜包括可编程集成电路,其包括控制元件和第一延迟元件和第二延迟元件中的至少一个。 控制元件被配置为产生适于控制检测器和测量系统的第一控制信号。 控制元件还被配置为产生适于控制激光光源的第二控制信号。 第一和第二延迟元件被配置为分别延迟第一和第二控制信号。

    MILLING STATION AND METHOD FOR GRINDING MILLING MATERIAL
    3.
    发明申请
    MILLING STATION AND METHOD FOR GRINDING MILLING MATERIAL 有权
    研磨站和研磨材料的方法

    公开(公告)号:US20090020636A1

    公开(公告)日:2009-01-22

    申请号:US11816247

    申请日:2006-02-14

    IPC分类号: B02C23/00

    CPC分类号: B02C21/002 B02C17/183

    摘要: The invention relates to a milling station and a method for grinding milling material by means of at least one coarse grinding circuit (1) and at least one fine grinding circuit (2). The coarse grinding circuit is provided with a classifier (10) and a material bed roller mill (11). The precrushed material of the material bed roller mill is fed to the classifier whose coarse material is redirected to the material bed roller mill and whose fine material is delivered to the fine grinding circuit. The fine grinding circuit encompasses a tube mill (20) with at least two grinding chambers (20a, 20b), a central outlet (20c), and a divider (21). At least some of the milling material of the coarse grinding circuit is subdivided in the divider and is delivered to the two grinding chambers while the milling material is jointly discharged from the two grinding chambers via the central outlet.

    摘要翻译: 本发明涉及一种研磨站和一种通过至少一个粗磨回路(1)和至少一个细研磨回路(2)研磨研磨材料的方法。 粗磨回路设有分级器(10)和料床辊磨机(11)。 将原料床辊磨机的预冲碎材料送入分选机,将粗料重新定向到料床辊磨机,并将其精细材料输送到细磨回路。 细磨回路包括具有至少两个研磨室(20a,20b),中心出口(20c)和分隔器(21)的管磨机(20)。 粗磨回路的至少一些铣削材料被细分成分隔件,并被输送到两个研磨室,同时铣削材料经由中心出口从两个研磨室共同排出。

    Milling station and method for grinding milling material
    5.
    发明授权
    Milling station and method for grinding milling material 有权
    铣床和铣削材料研磨方法

    公开(公告)号:US07971815B2

    公开(公告)日:2011-07-05

    申请号:US11816247

    申请日:2006-02-14

    IPC分类号: B02C21/00

    CPC分类号: B02C21/002 B02C17/183

    摘要: A milling station and a method for grinding milling material using at least one coarse grinding circuit and at least one fine grinding circuit. The coarse grinding circuit includes a classifier and a material bed roller mill. The fine grinding circuit includes a tube mill with at least two grinding chambers, a central outlet, and a divider. In some instances, at least some of the milling material from the coarse grinding circuit is subdivided in the divider and delivered to the at least two grinding chambers of the fine grinding circuit while some of the milling material is jointly discharged from the at least two grinding chambers through the central outlet.

    摘要翻译: 铣削台和使用至少一个粗磨回路和至少一个精磨回路研磨铣削材料的方法。 粗磨回路包括分级机和料床辊磨机。 细磨回路包括具有至少两个研磨室,中心出口和分隔器的管磨机。 在一些情况下,来自粗磨回路的至少一些铣削材料被细分成分隔件,并被输送到细磨回路的至少两个研磨室,而一些研磨材料从至少两个研磨 室通过中央出口。

    METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A MICROSCOPE FOR EXAMINING AN OBJECT
    6.
    发明申请
    METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A MICROSCOPE FOR EXAMINING AN OBJECT 有权
    用于检查对象的微观方法和用于检查对象的显微镜的方法

    公开(公告)号:US20110149290A1

    公开(公告)日:2011-06-23

    申请号:US12954629

    申请日:2010-11-25

    IPC分类号: G01N21/55 G02B21/06

    CPC分类号: G02B21/0032

    摘要: A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.

    摘要翻译: 用于检查物体的显微镜包括产生脉冲光以激发物体的激光光源。 包括检测器的测量系统适于检测来自物体的检测光,并且测量系统基于检测光产生测量信号。 显微镜包括可编程集成电路,其包括控制元件和第一延迟元件和第二延迟元件中的至少一个。 控制元件被配置为产生适于控制检测器和测量系统的第一控制信号。 控制元件还被配置为产生适于控制激光光源的第二控制信号。 第一和第二延迟元件被配置为分别延迟第一和第二控制信号。

    Separator for particulate materials
    8.
    发明授权
    Separator for particulate materials 失效
    颗粒材料分离器

    公开(公告)号:US5791490A

    公开(公告)日:1998-08-11

    申请号:US779800

    申请日:1997-01-07

    IPC分类号: B07B7/083 B07B7/08

    CPC分类号: B07B7/083

    摘要: The invention relates to a separator comprising a separator housing with an inlet spiral for separating air which opens tangentially into an annular separating chamber and is divided into a plurality of delivery channels which lie one above the other, as well as a basket-shaped separator rotor disposed centrally and with a vertical axis in the separator housing and a guide vane ring which surrounds the latter with a radial clearance. In order that this separator on the one hand has a high effectiveness of separation between oversize material and fine material and on the other hand facilitates a sufficiently broad grain size distribution of the fine material, the overall shape of the separator rotor is that of a cone which tapers downwards.

    摘要翻译: 本发明涉及一种分离器,其包括具有入口螺旋的分离器壳体,用于分离空气,该空气切向地打开成环形分隔室,并且被分成多个彼此位于一个上方的输送通道,以及一个篮状分离器转子 设置在中心并且在分离器壳体中具有垂直轴线;以及导向叶片环,其以径向间隙围绕其。 为了使该隔板一方面具有高尺寸尺寸的材料和细小材料之间的分离效果,另一方面促进了细料的足够宽的晶粒尺寸分布,分离器转子的整体形状是锥体 它向下变细。