公开(公告)号：US11768237B2

公开(公告)日：2023-09-26

申请号：US17663060

申请日：2022-05-12

Applicant: Google LLC

Inventor： Emre Tuncer ,  Kaushik Balamukundhan ,  Yiran Li

IPC: G01R31/30 ,  G01R31/3193

CPC classification number: G01R31/3008 ,  G01R31/31935

Abstract: This document describes techniques and systems for leakage screening based on power prediction. In particular, the described systems and techniques estimate, during a silicon manufacturing process, use-case power (e.g., low power, ambient power, high power, gaming power) to apply leakage screening for apart (e.g., a chip package). In some aspects, measurable silicon parameters (e.g., leakage values, bin values, processor sensor values) may be used for use-case power prediction. Using the described techniques, a maximum allowable predicted use-case power can be determined and used for leakage screening regardless of an individual rail leakage or voltage bin assignment.

公开(公告)号：US20220268835A1

公开(公告)日：2022-08-25

申请号：US17663060

申请日：2022-05-12

Applicant: Google LLC

Inventor： Emre Tuncer ,  Kaushik Balamukundhan ,  Yiran Li

IPC: G01R31/30 ,  G01R31/3193

Abstract: This document describes techniques and systems for leakage screening based on power prediction. In particular, the described systems and techniques estimate, during a silicon manufacturing process, use-case power (e.g., low power, ambient power, high power, gaming power) to apply leakage screening for apart (e.g., a chip package). In some aspects, measurable silicon parameters (e.g., leakage values, bin values, processor sensor values) may be used for use-case power prediction. Using the described techniques, a maximum allowable predicted use-case power can be determined and used for leakage screening regardless of an individual rail leakage or voltage bin assignment.