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公开(公告)号：US20190332365A1
公开(公告)日：2019-10-31
申请号：US16291237
申请日：2019-03-04
Applicant: Hitachi, Ltd.
Inventor： Yuki NAGANUMA , Hideki NAKAMURA , Toshio NISHIDA
Abstract: A flow preparation assisting apparatus calculates a difference between one or more flow data sets and a template flow data set having been a base of the one or more flow data sets, and calculates a dependency relation between node attributes for a template flow indicated by the template flow data set, from the calculated difference. The flow preparation assisting apparatus issues a notification according to the calculated dependency relation.
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Patent Agency Ranking
公开(公告)号：US20170161181A1
公开(公告)日：2017-06-08
申请号：US15071675
申请日：2016-03-16
Applicant: Hitachi, Ltd.
Inventor： Genta KOREKI , Jun MAEOKA , Hideki NAKAMURA
IPC: G06F11/36
CPC classification number: G06F11/3672
Abstract: An object of the invention is to provide efficient testing of software. A testing support apparatus stores a plurality of test scenarios including description concerning transition of screens, source codes constituting the software, and screen/source code correspondence information representing correspondence between the screens and the source codes related to generation of the screens, generates test scenario dividing information which is information including the results of dividing the description of each test scenario into a plurality of blocks in terms of the screens, sets execution priority levels for the plurality of test scenarios based on the test scenario dividing information, and sequentially executes the test scenarios in accordance with the execution priority levels. The testing support apparatus sets the execution priority levels for the plurality of test scenarios for each screen based on a criterion.
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3.发明申请公开(公告)号：US20190265954A1
公开(公告)日：2019-08-29
申请号：US16131897
申请日：2018-09-14
Applicant: HITACHI, LTD.
Inventor： Masanori KANEKO , Hideki NAKAMURA , Junji KINOSHITA
Abstract: A design pattern discovery assist apparatus presents one or more second node candidates, which are one or more candidates of a second node, when a first node is selected regarding a flow in the middle of being edited. The first node is any node corresponding to one type of node between an input node and an output node. The second node is a node corresponding to the first node among nodes corresponding to any type between the other type of node between the input node and the output node and an input/output node, which serves as both the input and the output nodes. When any second node candidate is selected as the second node, the assist apparatus presents one or more partial flow candidates which are one or more candidates of a partial flow between the first node and the second node.
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公开(公告)号：US20160378647A1
公开(公告)日：2016-12-29
申请号：US14782881
申请日：2014-07-30
Applicant: HITACHI, LTD.
Inventor： Jun MAEOKA , Hideki NAKAMURA , Akira TANAKA
IPC: G06F11/36
CPC classification number: G06F11/3688 , G06F11/28 , G06F11/36 , G06F11/3644 , G06F11/3668
Abstract: Provided is a development supporting system that extracts important test cases in accordance with development statuses of a program, test statuses, etc. The development supporting system according to a representative embodiment includes a configuration managing unit that retains and manages the program and each of the test cases in a repository, and a test executing unit that executes the test case and stores a test result in the repository. The test case is managed in the repository in association with information of a type thereof, the configuration managing unit judges a development status of the program and sets a priority for each of the test cases based on the development status, and the test executing unit extracts the test case to be executed based on the priority.
Abstract translation: 提供了根据程序的开发状态，测试状态等提取重要测试用例的开发支持系统。根据代表性实施例的开发支持系统包括配置管理单元，其保存和管理程序以及每个测试 存储库中的情况以及执行测试用例并将测试结果存储在存储库中的测试执行单元。 该测试用例在存储库中与其类型的信息相关联地进行管理，配置管理单元根据开发状态判断程序的开发状态并设置每个测试用例的优先级，并且测试执行单元提取 基于优先级执行的测试用例。
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5.发明申请公开(公告)号：US20190220549A1
公开(公告)日：2019-07-18
申请号：US16135516
申请日：2018-09-19
Applicant: HITACHI, LTD.
Inventor： Takaya IDE , Hiroshi NASU , Yuki NAGANUMA , Toshio NISHIDA , Hideki NAKAMURA
Abstract: An analysis model execution unit executing a part of an analysis model, an analysis model partial execution unit partially executing the analysis model based on intermediate data generated during execution of the analysis model, external storage storing the intermediate data and mapping information which is corresponding relationship between the intermediate data and the analysis model, and an analysis model general processing unit generating the mapping information by associating the intermediate data with the analysis model and reading the intermediate data associated with the analysis model from the external storage based on the mapping information are provided.
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公开(公告)号：US20180181550A1
公开(公告)日：2018-06-28
申请号：US15491368
申请日：2017-04-19
Applicant: HITACHI, LTD.
Inventor： Genta KOREKI , Jun MAEOKA , Hideyuki KANUKA , Hideki NAKAMURA
IPC: G06F17/22
CPC classification number: G06F8/38
Abstract: A screen information generation device analyzes, based on screen defining function information that is information about a function to define a screen, a source code to acquire screen definition information that is information related to definition of a screen described in the source code, and analyzes, based on screen transition function information that is information about a function to cause a screen to transition, the source code to thereby acquire screen transition-related information that is information about transition of a screen described in the source code, and generates, based on the screen definition information and the screen transition-related information, screen transition information including information indicative of a relationship between transition source screen information that is information about the screen of a transition source and transition destination screen information that is information about the screen of a transition destination.
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