MACHINE DIAGNOSTIC APPARATUS AND MACHINE DIAGNOSTIC METHOD

    公开(公告)号:US20180011480A1

    公开(公告)日:2018-01-11

    申请号:US15544298

    申请日:2015-01-20

    Applicant: HITACHI, LTD.

    CPC classification number: G05B23/0208 G01R31/343 G05B23/0227

    Abstract: An operation mode specifying unit specifies an operation mode of a machine by comparing time-series data of an amplitude and a frequency of measurement data obtained from a sensor with definition data of the operation mode of the machine created in advance by an operation mode data creation unit. In addition, an abnormality diagnosis unit performs processing of cluster analysis for the measurement data obtained from the sensor or the like, and diagnoses abnormality of the machine according to diagnosis procedure information that is set in advance depending on the set operation mode and an abnormality mode of the machine.

    Machine Diagnostic Device and Machine Diagnostic Method

    公开(公告)号:US20180059656A1

    公开(公告)日:2018-03-01

    申请号:US15557242

    申请日:2015-03-12

    Applicant: Hitachi, Ltd.

    Abstract: The purpose of the present invention is to provide a machine diagnostic device that assists with sensor attachment such that malfunction sensing performance may be maintained even after maintenance of a device. The machine diagnostic device includes a sensor data acquisition part that acquires time-series sensor data that are measured by sensors that are attached to a machine that has one or more operating modes; a learning unit that statistically processes the sensor data prior to detachment of the sensors and computes a normal operation model; a malfunction diagnostic unit that diagnoses a malfunction of the machine on the basis of the sensor data and the normal operation model; and a sensor adjustment unit that, when the sensors are re-attached to the machine after the sensors have been detached therefrom, displays, in a display unit, as a sensor adjustment mode, discrepancies between the normal operation model prior to the detachment of the sensors and the post sensor attachment sensor data.

Patent Agency Ranking