ION TRAP SYSTEM AND ION TRAPPING METHOD
    1.
    发明公开

    公开(公告)号:US20230178355A1

    公开(公告)日:2023-06-08

    申请号:US18159859

    申请日:2023-01-26

    IPC分类号: H01J49/42 H01J49/16

    摘要: An ion trap system and an ion trapping method are provided. The ion trap system may include: an ion source, configured to: generate an ion, and shoot the ion to an ion trap; the electromagnetic field device, configured to change a moving direction of the ion, to transfer the ion to an ion trap; and the ion trap, configured to trap the ion transferred by the electromagnetic field device. The electromagnetic field device changes the moving direction of the ion, to transfer the ion to the ion trap.

    ION TRAP SYSTEM
    2.
    发明申请

    公开(公告)号:US20210327605A1

    公开(公告)日:2021-10-21

    申请号:US17359909

    申请日:2021-06-28

    摘要: An ion trap system includes a laser adjustment and control module configured to split a light beam into P first light beams and Q second light beams. N first light beams in the P first light beams are transmitted to N ions, respectively, and tM second light beams in the Q second light beams are transmitted to M monitoring units, respectively. The M monitoring units are configured to monitor the M second light beams, respectively, and obtain spatial information of the M second light beams. The system further includes a feedback control module configured to receive the spatial intensity distribution information of the M second light beams, determine N first control signals based on the spatial information of the M second light beams, and transmit the N first control signals to the laser adjustment and control module.