公开(公告)号：US20030214653A1

公开(公告)日：2003-11-20

申请号：US10420250

申请日：2003-04-22

Applicant: Hach Company

Inventor： Perry A. Palumbo ,  Paul D. Schlegel ,  Jeffrey M. Huhta ,  Richard P. Kolman

IPC: G01N021/00

CPC classification number: G01N21/51 ,  G01N2201/0642

Abstract: A turbidimeter having an arrangement of internal surfaces, optical surfaces, and optical restrictions to the field of view of both the illumination and the detector means to significantly improve the lower detection limit of the turbidimeter by reducing the detected signal due to stray light.

Abstract translation: 具有内部表面，光学表面和对照明和检测器装置的视野的光学限制的浊度计，通过减少由于杂散光引起的检测信号来显着地提高浊度计的较低检测限。