STRAIN MAGNIFICATION
    2.
    发明申请

    公开(公告)号:US20210181043A1

    公开(公告)日:2021-06-17

    申请号:US17268019

    申请日:2018-12-13

    IPC分类号: G01L1/22 E21B47/00

    摘要: A strain magnification apparatus can have a first section and a second section coupled with the first section. The second section can have a lower stiffness relative to the first portion and a strain gauge coupled thereto. The first section is operable to be coupled to a tool experiencing strain and the tool is formed from a material having lower elasticity than the second section.