Pixel Array and Fabrication Method Thereof
    1.
    发明申请

    公开(公告)号:US20200013806A1

    公开(公告)日:2020-01-09

    申请号:US16405126

    申请日:2019-05-07

    IPC分类号: H01L27/12 G09G3/20 G09G3/22

    摘要: The present disclosure provides a pixel array and a fabrication method thereof. The pixel array includes a plurality of gate lines and a plurality of data lines which are arranged intersected and insulated and a pixel unit disposed at a position where each of the plurality of gate lines and each of the plurality of data lines are intersected. The pixel unit includes a thin film transistor (TFT).The width-to-length ratios of channels of the TFTs are sequentially increased in such a manner that the width-to-length ratios of the channels of the TFTs in the pixel units positioned in a same row (and/or a same column) are sequentially increased along a scanning direction of the gate line coupled to gate electrodes of the TFTs in the same row (and/or along a data writing direction of the data line coupled to the source electrodes of the TFTs in the same column).

    INSPECTION DEVICE AND INSPECTION METHOD FOR ARRAY SUBSTRATE

    公开(公告)号:US20200066195A1

    公开(公告)日:2020-02-27

    申请号:US16399859

    申请日:2019-04-30

    摘要: An inspection device includes: a driving circuit, configured to input display data of an image to a pixel electrode of the array substrate; a light-emitting device comprising a first electrode, a second electrode, and a plurality of light-emitting units arranged between the first electrode and the second electrode, and the plurality of light-emitting units is capable of emitting light under the effect of an electric field between the first electrode and the second electrode; a test circuit, configured to electrically connect the first electrode of the light-emitting device to the pixel electrode of the array substrate, and input a first electrical signal to the second electrode of the light-emitting device, to generate the electric field; and a processing circuit, configured to acquire optical information of the light emitted by the light-emitting device, and determine whether there is an electrical defect in the array substrate according to the optical information.

    DISPLAY PANEL AND MANUFACTURING METHOD THEREOF, AND DISPLAY APPARATUS

    公开(公告)号:US20190371867A1

    公开(公告)日:2019-12-05

    申请号:US16488924

    申请日:2019-01-31

    IPC分类号: H01L27/32 H01L51/56

    摘要: A display panel, a method for manufacturing the display panel, and a display apparatus are provided. The display panel includes a base substrate; a thin film transistor; an OLED structure formed on the thin film transistor including a first and second electrodes arranged opposite to each other and an organic light emitting layer arranged between the first and second electrodes; a light shielding layer arranged between the first electrode and the organic light emitting layer. The light shielding layer includes a first and a second light shielding layers. The first light shielding layer includes a first light shielding portion and a first opening portion corresponding to a pixel area. The second light shielding layer includes a second light shielding portion and a second opening portion corresponding to a pixel area. The second light shielding portion includes a first and second parts.

    TEST CIRCUIT, ARRAY SUBSTRATE, AND DISPLAY PANEL

    公开(公告)号:US20220108641A1

    公开(公告)日:2022-04-07

    申请号:US17429310

    申请日:2021-01-05

    IPC分类号: G09G3/00 H01L27/32

    摘要: The present invention relates to the technical field of display and provides a test circuit, an array substrate, and a display panel. The array substrate comprises a plurality of signal lines. The test circuit comprises: a plurality of first switch units having one-to-one correspondence with the signal lines, the first switch units having first ends connected to first ends of the signal lines, second ends mutually short-circuited, and control ends connected to first control signal ends; and a plurality of second switch units having one-to-one correspondence with the signal lines, the second switch units having first ends connected to second ends of the signal lines, second ends mutually short-circuited, and control ends connected to second control signal ends, wherein the plurality of first switch units and the plurality of second switch units have one-to-one correspondence with the signal lines.