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1.发明授权Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy 有权通过组合的X射线荧光分析和激光诱导击穿光谱法测定样品的材料成分的测量装置和方法公开(公告)号：US07233643B2
公开(公告)日：2007-06-19
申请号：US11134740
申请日：2005-05-20
IPC分类号： G01N23/233
CPC分类号： G01N21/718 , G01N23/223 , G01N2223/076
摘要： A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector (412) detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source (301) is adapted to produce a laser beam. Focusing optics (302) focus said laser beam into a focal spot on a surface of said sample. An optical sensor (312) detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem (104, 105, 106, 107, 108) is adapted to controllably deliver gas to a space (101) around said focal spot.
摘要翻译： 提供了用于确定样品的材料组成的测量装置和方法。 X射线荧光检测器（412）在入射的X射线照射下检测来自所述样品的荧光X射线。 激光源（301）适于产生激光束。 聚焦光学器件（302）将所述激光束聚焦到所述样品的表面上的焦斑中。 光学传感器（312）在所述焦点处暴露于所述激光束时检测来自所述样品的颗粒的光发射。 气体管理子系统（104,105,106,107,108）适于可控地将气体输送到围绕所述焦点的空间（101）。
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2.发明申请Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy 有权通过组合的X射线荧光分析和激光诱导击穿光谱法测定样品的材料成分的测量装置和方法公开(公告)号：US20060262900A1
公开(公告)日：2006-11-23
申请号：US11134740
申请日：2005-05-20
申请人： Heikki Sipila , Tero Eklin , Kai Kuparinen
发明人： Heikki Sipila , Tero Eklin , Kai Kuparinen
IPC分类号： G01N23/223 , G01T1/36
CPC分类号： G01N21/718 , G01N23/223 , G01N2223/076
摘要： A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector (412) detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source (301) is adapted to produce a laser beam. Focusing optics (302) focus said laser beam into a focal spot on a surface of said sample. An optical sensor (312) detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem (104, 105, 106, 107, 108) is adapted to controllably deliver gas to a space (101) around said focal spot.
摘要翻译： 提供了用于确定样品的材料组成的测量装置和方法。 X射线荧光检测器（412）在入射的X射线照射下检测来自所述样品的荧光X射线。 激光源（301）适于产生激光束。 聚焦光学器件（302）将所述激光束聚焦到所述样品的表面上的焦斑中。 光学传感器（312）在所述焦点处暴露于所述激光束时检测来自所述样品的颗粒的光发射。 气体管理子系统（104,105,106,107,108）适于可控地将气体输送到围绕所述焦点的空间（101）。
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