公开(公告)号：US5321363A

公开(公告)日：1994-06-14

申请号：US1851

申请日：1993-01-08

申请人： Hideki Wakamatsu ,  Nobuo Nakata ,  Yohichi Kuboyama ,  Hideshi Tanaka

发明人： Hideki Wakamatsu ,  Nobuo Nakata ,  Yohichi Kuboyama ,  Hideshi Tanaka

IPC分类号： G01R31/04 ,  G01R31/08

CPC分类号： G01R31/04

摘要： A two-terminal circuit element measuring apparatus of the present invention is capable of distinguishing a loose connection between a DUT and the measuring apparatus from a high impedance in the DUT. The measuring apparatus is also capable of measuring the impedance of the DUT without altering the connections between the DUT and the measuring apparatus. The measuring apparatus applies both DC and AC current signals to the DUT so as to compensate any leakage current occurring within the three-wire cable connecting the DUT and the measuring apparatus. Because of the compensation, when both DC and AC current ammeters indicate substantially zero values, it is assured that a loose connection exists.

摘要翻译： 本发明的两端子电路元件测量装置能够将DUT和测量装置之间的松动连接与DUT中的高阻抗区分开来。 测量装置还能够在不改变DUT和测量装置之间的连接的情况下测量DUT的阻抗。 测量装置将DC和AC电流信号应用于DUT，以补偿连接DUT和测量装置的三线电缆内发生的任何漏电流。 由于补偿，当直流和交流电流表都基本为零值时，确保存在松动的连接。