Apparatus for grinding semiconductor wafer
    2.
    发明授权
    Apparatus for grinding semiconductor wafer 失效
    磨削半导体波形的装置

    公开(公告)号:US5113622A

    公开(公告)日:1992-05-19

    申请号:US747494

    申请日:1991-08-19

    IPC分类号: B24B7/22 B24B37/04 B24B55/02

    CPC分类号: B24B7/228 B24B37/04 B24B55/02

    摘要: An apparatus is provided for grinding a semiconductor wafer, which includes a table having a work stage on which a semiconductor wafer to be ground is placed, at least the work stage being rotatable about an axis, and a grinding wheel which is movable in a direction perpendicular to or parallel to the work stage while being rotated about an axis parallel to the rotational axis of the work stage. In this apparatus, a semiconductor wafer is cooled during grinding. In order to perform cooling, the apparatus has an inlet flow path for guiding cooling liquid to a grinding surface of the grinding wheel, and an outlet flow path for collecting the cooling liquid which flows onto the work stage. The apparatus also includes a temperature detector, disposed in the outlet flow path, for detecting a temperature of the recovered cooling liquid. A rotational speed of the grinding wheel or the rotary table is controlled based on the temperature of the cooling liquid detected by the temperature detector.