公开(公告)号：US20140184215A1

公开(公告)日：2014-07-03

申请号：US14079915

申请日：2013-11-14

Applicant: Hitachi, Ltd.

Inventor： Akira NISHIMIZU ,  Atsushi ISHIHARA ,  Jun MATSUMOTO ,  Takayuki KAWANAKA

IPC: G01N27/90

CPC classification number: G01N27/902

Abstract: An eddy current testing apparatus includes: an eddy current testing probe having an eddy current testing coil arranged on a bottom portion of a casing; a pressing mechanism configured to press the eddy current testing probe so that the bottom portion of the eddy current testing probe is placed in contact with a part of an inner wall surface of a slot formed in an object to be inspected; a carriage configured to mount the pressing mechanism and the eddy current testing probe, the carriage traveling in a depth direction of the slot; and an eddy current testing control device configured to control defect detection for the inner wall surface of the slot by acquiring a detected eddy current signal from the eddy current testing coil.

Abstract translation: 涡流检测装置包括：涡流检测探头，其具有布置在壳体的底部上的涡流检测线圈; 按压机构，其构造为按压所述涡流检测用探针，使得所述涡流检测用探针的底部与形成在被检体内的槽的内壁面的一部分接触; 托架，其构造成安装所述按压机构和所述涡流检测探头，所述托架沿所述槽的深度方向行进; 以及涡流检测控制装置，被配置为通过从涡流检测线圈获取检测到的涡流信号来控制槽的内壁表面的缺陷检测。