Programmable Device, Error Storage System, and Electronic System Device
    1.
    发明申请
    Programmable Device, Error Storage System, and Electronic System Device 审中-公开
    可编程器件,错误存储系统和电子系统器件

    公开(公告)号:US20160335145A1

    公开(公告)日:2016-11-17

    申请号:US15110278

    申请日:2014-01-24

    Applicant: Hitachi, Ltd.

    Abstract: The present invention aims to provide a programmable device with a configuration memory that can hold the state of the occurrence abnormal situation that is difficult to assume such as a failure occurring in the programmable device due to the terrestrial radiation of the configuration memory, even during power off, in order to improve the reproducibility in device testing based on the held error information. The programmable device with the configuration memory includes: an error detection section for detecting an error in the configuration memory, and outputting the detected error as well as an address in which the error occurred, as error information; and an error information holding section provided with a non-volatile memory to store the output error information.

    Abstract translation: 本发明的目的在于提供一种具有配置存储器的可编程设备,即使在电源期间,由于配置存储器的地面辐射,可以保持难以产生的发生异常情况的状态,例如在可编程设备中发生的故障 以提高基于所保持的错误信息的设备测试中的再现性。 具有配置存储器的可编程设备包括:错误检测部分,用于检测配置存储器中的错误,并将检测到的错误以及发生错误的地址输出作为错误信息; 以及设置有用于存储输出错误信息的非易失性存储器的错误信息保持部。

Patent Agency Ranking