公开(公告)号：US20130241541A1

公开(公告)日：2013-09-19

申请号：US13787953

申请日：2013-03-07

申请人： HITACHI, LTD.

发明人： Hisashi ENDO ,  Akira NISHIMIZU ,  Noriyuki SADAOKA

IPC分类号： G01N27/87

CPC分类号： G01N27/87 ,  G01N27/902 ,  G01R33/385

摘要： Provided is an eddy current inspection device, an eddy current inspection probe and an eddy current inspection method that make it possible to detect defects existing in deeper parts of test objects. Three or more odd number of excitation coils are arranged at even intervals in a circumferential direction on a postulated circumference. Excitation currents applied to the excitation coils are controlled so that the phase difference between excitation currents applied to adjacent ones of the excitation coils arranged in the circumferential direction on the postulated circumference equals one cycle divided by the number of excitation coils. A magnetic field generated according to an eddy current occurring in the test object due to a magnetic field caused by the application of the excitation currents to the excitation coils is detected by use of a detector arranged on a postulated plane containing the postulated circumference but inside the postulated circumference.

摘要翻译： 提供涡流检查装置，涡流检查探针和涡流检查方法，可以检测测试对象的较深部分中存在的缺陷。 三个或更多个奇数个励磁线圈在假定圆周上沿圆周方向以均匀间隔布置。 控制施加到激励线圈的励磁电流，使得施加到在假想圆周上沿圆周方向布置的相邻激励线圈的激励电流之间的相位差等于一个周期除以激励线圈的数量。 通过使用布置在包含假定圆周的假定平面上的检测器来检测由于通过向激励线圈施加激励电流而引起的由磁场引起的在测试对象中产生的涡流产生的磁场， 假定圆周

公开(公告)号：US20140003573A1

公开(公告)日：2014-01-02

申请号：US13928162

申请日：2013-06-26

申请人： Hitachi, Ltd.

发明人： Noriyuki SADAOKA ,  Yasushi NAGUMO

IPC分类号： G01N23/04

CPC分类号： G01N23/046 ,  G01N2223/419

摘要： The invention relates to an X-ray CT system for measuring three-dimensional shapes, while the X-ray system is capable of extracting three-dimensional shape information with high accuracy in consideration of beam hardening depending on a material and thickness of a specimen. The X-ray CT system includes an optical distance meter and a CT image analyzing unit. The optical distance meter measures an outer shape of the specimen simultaneously with a measurement of projection data. The CT image analyzing unit calculates a boundary threshold for the specimen on the basis of a CT image and a measurement value of the outer shape.

摘要翻译： 本发明涉及一种用于测量三维形状的X射线CT系统，而X射线系统能够根据样本的材料和厚度考虑光束硬化而以高精度提取三维形状信息。 X射线CT系统包括光学距离计和CT图像分析单元。 光学距离计与投影数据的测量同时测量样本的外形。 CT图像分析单元基于CT图像和外部形状的测量值来计算样本的边界阈值。

公开(公告)号：US20140079180A1

公开(公告)日：2014-03-20

申请号：US14018631

申请日：2013-09-05

申请人： Hitachi, Ltd.

发明人： Yasushi NAGUMO ,  Noriyuki SADAOKA

IPC分类号： G01N23/04

CPC分类号： G01N23/046 ,  G01N2223/419

摘要： An object of this invention is to provide a tomography method and a tomography system capable of tomographic imaging targeted uniquely to the test object among subjects under test. The method involves performing a process of generating projection data about the region of interest by selecting one reference projection data set from a plurality of projection data generated in a tomography process using a plurality of X-ray energy levels and by subtracting from the reference projection data set the product of an attenuation coefficient and the transmission length of the material configuring any region other than the region of interest detected by detector elements of detectors, and performing an image reconstruction computing process to generate a tomographic or stereoscopic image of the region of interest through image reconstruction based on the projection data about the region of interest generated in the projection data generating process.

摘要翻译： 本发明的一个目的是提供一种能够在被测试对象中独立地对待测试对象进行断层成像的层析成像方法和断层摄影系统。 该方法包括执行通过使用多个X射线能量级别从断层摄影处理中生成的多个投影数据中选择一个参考投影数据集并从参考投影数据中减去来产生关于感兴趣区域的投影数据的处理 设置衰减系数的乘积和构成由检测器的检测器元件检测到的感兴趣区域以外的任何区域的材料的传输长度，以及执行图像重建计算处理，以通过以下方式生成感兴趣区域的断层摄影或立体图像： 基于关于在投影数据生成处理中生成的感兴趣区域的投影数据的图像重建。