公开(公告)号：US12066471B2

公开(公告)日：2024-08-20

申请号：US18236315

申请日：2023-08-21

申请人： Hitachi Energy Ltd

发明人： Loganadhan V ,  Mahesh Ramachandra ,  Manjunath AJ ,  Shambhulingappa S

IPC分类号： G01R19/25 ,  G01R1/20 ,  G01R35/00

CPC分类号： G01R19/2513 ,  G01R1/20 ,  G01R35/00

摘要： Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.