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公开(公告)号：US11320309B2
公开(公告)日：2022-05-03
申请号：US17349225
申请日：2021-06-16
Applicant: Hitachi High-Tech Corporation
Inventor： Kei Shimura , Mizuki Oku , Kenji Aiko
Abstract: This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
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公开(公告)号：US11079275B2
公开(公告)日：2021-08-03
申请号：US15743151
申请日：2015-07-22
Applicant: Hitachi High-Tech Corporation
Inventor： Kei Shimura , Mizuki Oku , Kenji Aiko
Abstract: This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
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公开(公告)号：US10948347B2
公开(公告)日：2021-03-16
申请号：US16689802
申请日：2019-11-20
Applicant: Hitachi High-Tech Corporation
Inventor： Kei Shimura , Mizuki Oku , Kenji Aiko
Abstract: This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
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