-
公开(公告)号：US11644418B2
公开(公告)日：2023-05-09
申请号：US17409122
申请日：2021-08-23
Applicant: Hitachi High-Tech Corporation
Inventor： Kei Shimura , Mizuki Mohara , Kenji Aiko
IPC: G01N21/3581
CPC classification number: G01N21/3581 , G01N2201/064 , G01N2201/0633 , G01N2201/0636 , G01N2201/0638 , G01N2201/06113
Abstract: The present invention provides a far-infrared light source capable of reducing the shift in the location irradiated with far-infrared light even when the frequency of the far-infrared light changes. A far-infrared light source according to the present invention is configured so that the variation in the emission angle of far-infrared light in a nonlinear optical crystal when the frequency of the far-infrared light changes is substantially offset by the variation in the refractive angle of the far-infrared light at the interface between the nonlinear optical crystal and a prism when the frequency of the far-infrared light changes (see FIG. 8).
-
Patent Agency Ranking
公开(公告)号：US12196670B2
公开(公告)日：2025-01-14
申请号：US18007942
申请日：2020-06-22
Applicant: Hitachi High-Tech Corporation
Inventor： Touya Ono , Mizuki Mohara , Kei Shimura , Kenji Aiko
IPC: G01N21/3581
Abstract: This far-infrared spectroscopy device comprises a holding mechanism that is capable of holding a sample in humid air, a detector for detecting light obtained by emitting far infrared light onto the sample, and a signal processing unit for calculating an absorption spectrum of the sample from a signal from the detector. The signal processing unit comprises a threshold processing unit that subjects the signal from the detector to threshold processing and removes the part of the signal influenced by the absorption by the water vapor in the humid air, a signal interpolation unit that carries out interpolation on the signal that has been subjected to the removal by the threshold processing unit, and an absorbance calculation unit for calculating an absorbance from the signal that has been subjected to the interpolation by the signal interpolation unit.
-
公开(公告)号：US11977026B2
公开(公告)日：2024-05-07
申请号：US17781259
申请日：2019-12-27
Applicant: Hitachi High-Tech Corporation
Inventor： Mizuki Mohara , Kei Shimura , Kenji Aiko
IPC: G01N21/3581 , G01J3/10 , G01J3/14 , G01J3/28 , G02F1/355
CPC classification number: G01N21/3581 , G01J3/108 , G01J3/14 , G01J3/2803 , G02F1/3551
Abstract: This invention addresses the abovementioned problem, and the purpose of this invention is to provide a far-infrared spectroscopy device that uses an is-TPG method to generate far-infrared light, and is capable of efficiently detecting is-TPG light without a detection optical system being fine-tuned. Even if the far-infrared light incidence angles on an Si prism for detection are the same when far-infrared light having a first frequency is incident on a non-linear optical crystal for detection and when far-infrared light having a second frequency is incident on the non-linear optical crystal for detection, this far-infrared spectroscopy device adjusts the incidence surface angle of pump light in relation to the non-linear optical crystal for detection such that the angle of the far-infrared light in relation to the pump light within the non-linear optical crystal for detection can be appropriately set for each far-infrared light frequency (see FIG. 1A).
-
公开(公告)号：US11320309B2
公开(公告)日：2022-05-03
申请号：US17349225
申请日：2021-06-16
Applicant: Hitachi High-Tech Corporation
Inventor： Kei Shimura , Mizuki Oku , Kenji Aiko
Abstract: This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
-
公开(公告)号：US11079275B2
公开(公告)日：2021-08-03
申请号：US15743151
申请日：2015-07-22
Applicant: Hitachi High-Tech Corporation
Inventor： Kei Shimura , Mizuki Oku , Kenji Aiko
Abstract: This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
-
公开(公告)号：US10948347B2
公开(公告)日：2021-03-16
申请号：US16689802
申请日：2019-11-20
Applicant: Hitachi High-Tech Corporation
Inventor： Kei Shimura , Mizuki Oku , Kenji Aiko
Abstract: This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
-
-
-
-
-
Search Results
6
records
(took 0.015 seconds)
