公开(公告)号：US20240125850A1

公开(公告)日：2024-04-18

申请号：US18397481

申请日：2023-12-27

Applicant: Huawei Technologies Co., Ltd.

Inventor： Huiling Zhen ,  Miaohui Chen ,  Mingxuan Yuan ,  Naixing Wang ,  Wanqian Luo ,  Yu Huang

IPC: G01R31/3181 ,  G01R31/3177 ,  G01R31/3183 ,  G01R31/3185

CPC classification number: G01R31/31813 ,  G01R31/3177 ,  G01R31/318342 ,  G01R31/318544

Abstract: An automatic test pattern generation-based circuit verification method, comprises: determining a to-be-detected first logic cone from a fan-out logic cone corresponding to the target line; determining, based on the first logic cone, a to-be-detected second logic cone from a fan-in logic cone corresponding to the target line; generating a first CNF based on the first logic cone and the second logic cone, and detecting the target line by using the first CNF to obtain a first detection result; and if the first logic cone is a partial region in the fan-out logic cone, and the first detection result meets a first specified condition corresponding to the first logic cone, determining a first verification result of the target line based on the first detection result.