公开(公告)号：US20090110151A1

公开(公告)日：2009-04-30

申请号：US11928638

申请日：2007-10-30

申请人： Michael A. Damento ,  Hugh F. Garvey

发明人： Michael A. Damento ,  Hugh F. Garvey

IPC分类号： G03C5/16

CPC分类号： G01T1/20

摘要： The system includes a conductive window, a spectrum changing layer, a fiber optic bundle, a camera sensor, and a power supply. The spectrum changing layer is excited by the x-rays and emits a different wavelength of light, such as visible light. The fiber optic bundle receives the visible light from the spectrum changing material and transmits the visible light to the camera sensor. The camera sensor detects the light emitted from the spectrum changing layer and converts the information to electronic signals. The camera sensor is cooled by a cooling device, as such thermal conduction may cool the fiber optic bundle. To avoid condensation, current may flow through the conductive window thereby heating the conductive window.

摘要翻译： 该系统包括导电窗，光谱变换层，光纤束，相机传感器和电源。 光谱变化层被X射线激发并发射不同波长的光，例如可见光。 光纤束从光谱变换材料接收可见光，并将可见光透射到照相机传感器。 摄像机传感器检测从频谱变化层发出的光，并将信息转换为电子信号。 相机传感器由冷却装置冷却，因为这样的热传导可以冷却光纤束。 为了避免冷凝，电流可能流过导电窗，从而加热导电窗。

公开(公告)号：US20130101091A1

公开(公告)日：2013-04-25

申请号：US13587410

申请日：2012-08-16

申请人： Hugh F. Garvey ,  Michael A. Damento

发明人： Hugh F. Garvey ,  Michael A. Damento

IPC分类号： G01N23/201

CPC分类号： G01N23/201

摘要： A detector system for capturing and resolving WAXS and SAXS beams is provided along with a device for determining structural information of a material incorporating said detector system and a method for examining the structure of a material using said detector system. The detector system generally comprises a sample capable of interacting with the incident x-ray beam, a primary detector and a secondary detector. Upon interaction with a sample of the material, the incident x-ray beam is scattered into wide angle x-ray scattering (WAXS) beams and small angle x-ray scattering (SAXS) beams that are captured by the primary or secondary detectors.

摘要翻译： 提供了用于捕获和分辨WAXS和SAXS光束的检测器系统以及用于确定包含所述检测器系统的材料的结构信息的装置以及使用所述检测器系统检查材料的结构的方法。 检测器系统通常包括能够与入射的X射线束相互作用的样本，初级检测器和次级检测器。 在与材料样品相互作用时，入射的X射线束被散射到由主要或次要检测器捕获的广角X射线散射（WAXS）光束和小角度X射线散射（SAXS）光束中。

公开(公告)号：US07684545B2

公开(公告)日：2010-03-23

申请号：US11928638

申请日：2007-10-30

申请人： Michael A. Damento ,  Hugh F. Garvey

发明人： Michael A. Damento ,  Hugh F. Garvey

IPC分类号： G21K1/00 ,  H05G1/64

CPC分类号： G01T1/20

摘要： The system includes a conductive window, a spectrum changing layer, a fiber optic bundle, a camera sensor, and a power supply. The spectrum changing layer is excited by the x-rays and emits a different wavelength of light, such as visible light. The fiber optic bundle receives the visible light from the spectrum changing material and transmits the visible light to the camera sensor. The camera sensor detects the light emitted from the spectrum changing layer and converts the information to electronic signals. The camera sensor is cooled by a cooling device, as such thermal conduction may cool the fiber optic bundle. To avoid condensation, current may flow through the conductive window thereby heating the conductive window.

摘要翻译： 该系统包括导电窗，光谱变换层，光纤束，相机传感器和电源。 光谱变化层被X射线激发并发射不同波长的光，例如可见光。 光纤束从光谱变换材料接收可见光，并将可见光透射到照相机传感器。 摄像机传感器检测从频谱变化层发出的光，并将信息转换为电子信号。 相机传感器由冷却装置冷却，因为这样的热传导可以冷却光纤束。 为了避免冷凝，电流可能流过导电窗，从而加热导电窗。