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公开(公告)号：US20050243228A1
公开(公告)日：2005-11-03
申请号：US11117291
申请日：2005-04-29
申请人： Hyun Lee , See Jeong , Seung Choi
发明人： Hyun Lee , See Jeong , Seung Choi
IPC分类号： G02F1/1343 , G02F1/136
CPC分类号： G02F1/134363
摘要： A liquid crystal display and a fabricating method thereof for improving an aperture ratio are disclosed. A liquid crystal display (LCD) according to the present invention includes a gate line, a data line and a common line on the thin film transistor array substrate, the gate line crossing the data line to define a pixel region; a thin film transistor near the crossing of the gate line and the data line; a common electrode connected to the common line in the pixel region; and a pixel electrode connected to the thin film transistor in the pixel area for forming an in-plane electric field in association with the common electrode during an operation of the LCD, wherein an edge of the pixel electrode overlaps the common line with at least one insulating layer therebetween, and an edge of the common electrode overlaps the pixel electrode with said at least one insulating layer therebetween.
摘要翻译： 公开了一种用于提高开口率的液晶显示器及其制造方法。 根据本发明的液晶显示器（LCD）包括在薄膜晶体管阵列基板上的栅极线，数据线和公共线，栅极线与数据线交叉以限定像素区域; 靠近栅极线和数据线交叉的薄膜晶体管; 连接到像素区域中的公共线的公共电极; 以及像素电极，连接到所述像素区域中的所述薄膜晶体管，用于在所述LCD的操作期间与所述公共电极相关联地形成平面内电场，其中所述像素电极的边缘与所述公共线重叠至少一个 绝缘层之间，并且所述公共电极的边缘与所述至少一个绝缘层与所述像素电极重叠。
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公开(公告)号：US20060176072A1
公开(公告)日：2006-08-10
申请号：US11391569
申请日：2006-03-29
IPC分类号： G01R31/00
CPC分类号： G02F1/136259 , G02F1/1303 , G02F1/136213 , G02F2001/136254 , G02F2001/136268 , G02F2203/69 , G09G3/006 , G09G3/3648 , G09G2300/0426
摘要： A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.
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公开(公告)号：US20070024315A1
公开(公告)日：2007-02-01
申请号：US11541577
申请日：2006-10-03
IPC分类号： G01R31/00
CPC分类号： G09G3/006
摘要： A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.
摘要翻译： 提供了一种用于检查液晶显示基板的电气缺陷性的方法和装置。 该方法包括用导电短路棒短路ESD保护装置，以在基板的每个信号布线上形成电流路径，向信号布线提供电流，以及根据在信号上流动的电流来确定信号布线的缺陷 布线。
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